Wheatcroft Laura, Klingner Nico, Heller René, Hlawacek Gregor, Özkaya Doğan, Cookson James, Inkson Beverley J
Department of Materials Science and Engineering, University of Sheffield, Mappin Street, Sheffield S1 3JD, U.K.
Helmholtz Zentrum Dresden-Rossendorf, Bautzner Landstraβe 400, Dresden 01328, Germany.
ACS Appl Energy Mater. 2020 Sep 28;3(9):8822-8832. doi: 10.1021/acsaem.0c01333. Epub 2020 Aug 25.
Unstable cathode electrolyte interphase (CEI) formation increases degradation in high voltage Li-ion battery materials. Few techniques couple characterization of nano-scale CEI layers on the macroscale with chemical characterization, and thus, information on how the underlying microstructure affects CEI formation is lost. Here, the process of CEI formation in a high voltage cathode material, LiCoPO, has been investigated for the first time using helium ion microscopy (HIM) and time-of-flight (ToF) secondary ion mass spectrometry (SIMS). The combination of HIM and Ne-ion ToF-SIMS has been used to correlate the cycle-dependent morphology of the CEI layer on LiCoPO with a local cathode microstructure, including position, thickness, and chemistry. HIM imaging identified partial dissolution of the CEI layer on discharge resulting in in-homogenous CEI coverage on larger LiCoPO agglomerates. Ne-ion ToF-SIMS characterization identified oxyfluorophosphates from HF attack by the electrolyte and a Li-rich surface region. Variable thickness of the CEI layer coupled with inactive Li on the surface of LiCoPO electrodes contributes to severe degradation over the course of 10 cycles. The HIM-SIMS technique has potential to further investigate the effect of microstructures on CEI formation in cathode materials or solid electrolyte interphase formation in anodes, thus aiding future electrode development.
不稳定的阴极电解质界面(CEI)形成会加剧高压锂离子电池材料的降解。很少有技术能将宏观尺度上纳米级CEI层的表征与化学表征相结合,因此,关于底层微观结构如何影响CEI形成的信息就丢失了。在此,首次使用氦离子显微镜(HIM)和飞行时间(ToF)二次离子质谱(SIMS)研究了高压阴极材料LiCoPO中CEI的形成过程。HIM和Ne离子ToF-SIMS的结合已被用于将LiCoPO上CEI层的循环依赖性形态与局部阴极微观结构相关联,包括位置、厚度和化学组成。HIM成像确定了放电时CEI层的部分溶解,导致在较大的LiCoPO团聚体上CEI覆盖不均匀。Ne离子ToF-SIMS表征确定了电解质HF侵蚀产生的氧氟磷酸盐和富锂表面区域。LiCoPO电极表面CEI层厚度的变化以及不活跃的锂导致在10个循环过程中严重降解。HIM-SIMS技术有潜力进一步研究微观结构对阴极材料中CEI形成或阳极中固体电解质界面形成的影响,从而有助于未来电极的开发。