Tessmer Joseph, Singh Saransh, Gu Yejun, El-Awady Jaafar A, Graef Marc De
Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA.
Lawrence Livermore National Lab, Computational Engineering Division, Livermore, CA 94550, USA.
Ultramicroscopy. 2020 Dec;219:113124. doi: 10.1016/j.ultramic.2020.113124. Epub 2020 Sep 24.
Scanning Transmission Electron Microscopy Diffraction Contrast Imaging (STEM-DCI) has been gaining popularity for the identification and analysis of dislocations in crystalline materials due to its ability to supress undesirable image features that are often present in conventional TEM images. However, there does not yet exist a robust body of work demonstrating expected contrast in these imaging conditions. A novel approach for the simulation of STEM-DCI images was developed using a modified form of the scattering matrix formalism. This algorithm was used to simulate a variety of dislocation configurations generated using three-dimensional discrete dislocation dynamics.
扫描透射电子显微镜衍射衬度成像（STEM-DCI）因其能够抑制传统透射电镜图像中常见的不良图像特征，在晶体材料中位错的识别与分析方面越来越受到欢迎。然而，目前尚未有大量的研究工作能够证明在这些成像条件下的预期衬度。利用一种改进形式的散射矩阵形式体系，开发了一种模拟STEM-DCI图像的新方法。该算法用于模拟使用三维离散位错动力学生成的各种位错构型。
