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使用牙科医疗设备系统制作的氧化锆增强硅酸锂全冠研磨精度的评估:三维分析

Evaluation of the Milling Accuracy of Zirconia-Reinforced Lithium Silicate Crowns Fabricated Using the Dental Medical Device System: A Three-Dimensional Analysis.

作者信息

Kang Seen-Young, Yu Ji-Min, Lee Jun-Seok, Park Ki-Sook, Lee Seung-Youl

机构信息

Medical Device Research Division, National Institute of Food and Drug Safety Evaluation, Chungcheong buk-do 28159, Korea.

出版信息

Materials (Basel). 2020 Oct 21;13(20):4680. doi: 10.3390/ma13204680.

Abstract

This study aimed to analyze the milling accuracy of lithium disilicate and zirconia-reinforced silicate crown fabricated using chairside computer-aided design/manufacturing (CAD/CAM) system. Mandibular left first premolar was selected for abutment. A master model was obtained for digital impression using an intraoral scanner, and crowns were designed using a CAD software design program. Amber Mill (AM), IPS e max CAD (IPS), and CELTRA DUO (CEL) were used in the CAD/CAM system, and a total 45 crowns (15 crowns each for AM, IPS, and CEL) was fabricated. Milling accuracy was analyzed with respect to trueness, measured by superimposing CAD design data and scan data through a three-dimensional program to compare the outer and inner surfaces and internal and external parts, thereby acquiring both quantitative and qualitative data. Data were analyzed using the non-parametric test and Kruskal-Wallis H test. In addition, the Mann-Whitney U test was used by applying the level of significance (0.05/3 = 0.016) adjusted by post-analysis Bonferroni correction. All the measured parts of the lithium disilicate and zirconia-reinforced silicate crowns showed statistically significant differences ( < 0.05). The lithium disilicate (AM and IPS) materials showed superior milling accuracy than the zirconia-reinforced lithium silicate (CEL) materials.

摘要

本研究旨在分析使用椅旁计算机辅助设计/制造(CAD/CAM)系统制作的二硅酸锂和氧化锆增强型硅酸盐全冠的研磨精度。选择下颌左侧第一前磨牙作为基牙。使用口腔内扫描仪获取主模型进行数字印模,并使用CAD软件设计程序设计全冠。在CAD/CAM系统中使用Amber Mill(AM)、IPS e max CAD(IPS)和CELTRA DUO(CEL),共制作45个全冠(AM、IPS和CEL各15个)。通过三维程序将CAD设计数据和扫描数据叠加,比较外表面和内表面以及内部和外部部分,以此测量吻合度,分析研磨精度,从而获取定量和定性数据。使用非参数检验和Kruskal-Wallis H检验分析数据。此外,采用经事后分析Bonferroni校正调整的显著性水平(0.05/3 = 0.016)进行Mann-Whitney U检验。所有二硅酸锂和氧化锆增强型硅酸盐全冠的测量部位均显示出统计学上的显著差异(<0.05)。二硅酸锂(AM和IPS)材料的研磨精度优于氧化锆增强型硅酸锂(CEL)材料。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/16ad/7589780/3cf56e60b206/materials-13-04680-g001.jpg

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