Liu Yi, Wang Ming, Wan Wenjie, Zhou Jianbin, Hong Xu, Liu Fei, Yu Jie
College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, Chengdu 610059, People's Republic of China.
J Synchrotron Radiat. 2020 Nov 1;27(Pt 6):1609-1613. doi: 10.1107/S1600577520010954. Epub 2020 Sep 25.
Under the condition of high counting rate, the phenomenon of nuclear pulse signal pile-up using a single exponential impulse shaping method is still very serious, and leads to a severe loss in counting rate. A real nuclear pulse signal can be expressed as a dual-exponential decay function with a certain rising edge. This paper proposes a new dual-exponential impulse shaping method and shows its deployment in hardware to test its performance. The signal of a high-performance silicon drift detector under high counting rate in an X-ray fluorescence spectrometer is obtained. The result of the experiment shows that the new method can effectively shorten the dead-time caused by nuclear signal pile-up and correct the counting rate.
在高计数率条件下，采用单指数脉冲成形方法时核脉冲信号堆积现象仍然非常严重，并导致计数率严重损失。实际的核脉冲信号可表示为具有一定上升沿的双指数衰减函数。本文提出了一种新的双指数脉冲成形方法，并展示了其硬件实现以测试其性能。获得了X射线荧光光谱仪中高性能硅漂移探测器在高计数率下的信号。实验结果表明，新方法可以有效缩短核信号堆积引起的死时间并校正计数率。
