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在 X 射线束扫描期间,组织中切伦科夫激发的分子报告物的理论侧向和轴向灵敏度限制及选择。

Theoretical lateral and axial sensitivity limits and choices of molecular reporters for Cherenkov-excited luminescence in tissue during x-ray beam scanning.

机构信息

Thayer School of Engineering, Dartmouth College, Hanover, New Hampshire, United States.

出版信息

J Biomed Opt. 2020 Nov;25(11). doi: 10.1117/1.JBO.25.11.116004.

Abstract

PURPOSE

Unlike fluorescence imaging utilizing an external excitation source, Cherenkov emissions and Cherenkov-excited luminescence occur within a medium when irradiated with high-energy x-rays. Methods to improve the understanding of the lateral spread and axial depth distribution of these emissions are needed as an initial step to improve the overall system resolution.

METHODS

Monte Carlo simulations were developed to investigate the lateral spread of thin sheets of high-energy sources and compared to experimental measurements of similar sources in water. Additional simulations of a multilayer skin model were used to investigate the limits of detection using both 6- and 18-MV x-ray sources with fluorescence excitation for inclusion depths up to 1 cm.

RESULTS

Simulations comparing the lateral spread of high-energy sources show approximately 100  ×   higher optical yield from electrons than photons, although electrons showed a larger penumbra in both the simulations and experimental measurements. Cherenkov excitation has a roughly inverse wavelength squared dependence in intensity but is largely redshifted in excitation through any distance of tissue. The calculated emission spectra in tissue were convolved with a database of luminescent compounds to produce a computational ranking of potential Cherenkov-excited luminescence molecular contrast agents.

CONCLUSIONS

Models of thin x-ray and electron sources were compared with experimental measurements, showing similar trends in energy and source type. Surface detection of Cherenkov-excited luminescence appears to be limited by the mean free path of the luminescence emission, where for the given simulation only 2% of the inclusion emissions reached the surface from a depth of 7 mm in a multilayer tissue model.

摘要

目的

与利用外部激发源的荧光成像不同,当用高能 X 射线照射时,切伦科夫辐射和切伦科夫受激辐射会在介质中发生。需要改进对这些辐射的横向扩展和轴向深度分布的理解的方法,作为提高整体系统分辨率的初始步骤。

方法

开发了蒙特卡罗模拟来研究高能源的薄板的横向扩展,并将其与水相似源的实验测量进行比较。使用多层皮肤模型的附加模拟,研究了使用 6 和 18 MV X 射线源的荧光激发,包括深度达 1 厘米的探测极限。

结果

比较高能源的横向扩展的模拟表明,电子的光产率比光子高约 100 倍,尽管在模拟和实验测量中电子的半影都更大。切伦科夫激发的强度与波长的平方成反比,但在任何组织距离的激发中都会发生很大的红移。组织中的计算发射光谱与发光化合物的数据库进行卷积,以产生潜在切伦科夫受激发光分子对比剂的计算排名。

结论

对薄 X 射线和电子源的模型与实验测量进行了比较,显示出能量和源类型的相似趋势。表面检测切伦科夫受激辐射似乎受到发光发射的平均自由程的限制,在给定的模拟中,只有 2%的包含发射从深度为 7 毫米的多层组织模型的表面到达表面。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/b0ef/7658603/09c6f9bf6225/JBO-025-116004-g001.jpg

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