Farha Ashraf H, Ibrahim Mervat M, Mansour Shehab A
Department of Physics, College of Science, King Faisal University, Al Ahsa 31982, Saudi Arabia.
Department of Physics, Faculty of Science, Ain Shams University, Cairo 11566, Egypt.
Materials (Basel). 2020 Nov 16;13(22):5152. doi: 10.3390/ma13225152.
Gallium (Ga) doped zinc oxide (ZnO) nanocrystals were successfully synthesized via a γ-radiation-assisted polymer-pyrolysis route. Ga doped ZnO samples with Ga and ZnO precursor salts with molar ratios of 0%, 3%, 5%, and 10% were produced. A γ-radiation dosage of 1.5 kGy was used for polymerization initiation during the sample preparation. The properties of the obtained nanocrystal samples were characterized using X-ray diffraction (XRD), Fourier transform infrared (FTIR), UV-visible absorption, NIR-VIS-UV diffused reflectance, and high-resolution transmission electron microscopy (HR-TEM) characterization techniques. XRD results revealed the formation of ZnO nanocrystals with wurtzite structure for both Ga-doped and undoped ZnO samples. Noticeable increasing in the line broadening of the XRD peaks as well as pronounced decreasing of crystallite size were observed with the increasing Ga ratio in the samples. Optical peaks around Ga:ZnO samples showed a blueshift in the optical absorption peaks with increasing Ga content. These results are in good agreement with the dependency of crystallites size as well as grain size on Ga ratio obtained from XRD and TEM images, which make them fit well for the powder cool-pigment applications. The doped samples showed high values of NIR reflectance (RNIR*) with percentage varied from 84.25% to 89.05% that enabled them to qualify for cool-nanopigment applications. Furthermore, such doped samples registered low values of visible reflectance (RVIS*) that enabled to reduce the glare from the reflected visible sunlight.
通过γ辐射辅助的聚合物热解路线成功合成了镓(Ga)掺杂的氧化锌(ZnO)纳米晶体。制备了Ga与ZnO前驱体盐摩尔比分别为0%、3%、5%和10%的Ga掺杂ZnO样品。在样品制备过程中,使用1.5 kGy的γ辐射剂量引发聚合反应。采用X射线衍射(XRD)、傅里叶变换红外光谱(FTIR)、紫外-可见吸收光谱、近红外-可见-紫外漫反射光谱以及高分辨率透射电子显微镜(HR-TEM)等表征技术对所得纳米晶体样品的性能进行了表征。XRD结果表明,Ga掺杂和未掺杂的ZnO样品均形成了纤锌矿结构的ZnO纳米晶体。随着样品中Ga比例的增加,观察到XRD峰的线宽明显增加,微晶尺寸显著减小。Ga:ZnO样品周围的光学峰显示,随着Ga含量的增加,光吸收峰发生蓝移。这些结果与从XRD和TEM图像获得的微晶尺寸以及晶粒尺寸对Ga比例的依赖性非常吻合,这使得它们非常适合用于粉末冷颜料应用。掺杂样品显示出较高的近红外反射率(RNIR*)值,百分比从84.25%到89.05%不等,这使它们有资格用于冷纳米颜料应用。此外,此类掺杂样品的可见光反射率(RVIS*)值较低,能够减少反射的可见太阳光产生的眩光。