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理解水平扭折氮化镓纳米线的同质外延生长。

Understanding homoepitaxial growth of horizontal kinked GaN nanowires.

作者信息

Wu Shaoteng, Yi Xiaoyan, Tian Shuang, Zhang Shuo, Liu Zhiqiang, Wang Liancheng, Wang Junxi, Li Jinmin

机构信息

State Key Laboratory of Solid-State Lighting, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, People's Republic of China.

Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences Beijing, 100049, People's Republic of China.

出版信息

Nanotechnology. 2021 Feb 26;32(9):095606. doi: 10.1088/1361-6528/abcc24.

Abstract

Epitaxial horizontal nanowires (NWs) have attracted much attention due to their easily large-scale integration. From the reported literature, epitaxial growth is usually driven by minimization of strain between NW and substrate, which governs the growth along with specific crystallographic orientation. Here, we report the first homoepitaxial growth of horizontal GaN NWs from a surface-directed vapor-liquid-solid growth method. The NWs grow along with six symmetry-equivalent 〈1-100〉 (m-axis) directions, exhibiting a random 60°/120° kinked configuration. Owing to homoepitaxial growth, strain could be eliminated. From the obtained results, we suggest that the formation the horizontal NWs, and their growth direction /orientation is not directly related to the strain minimization. A general rule based on the epitaxial relationship and potential low-index growth orientation is proposed for understanding the arrangement of epitaxial horizontal NWs. It is deduced that kinking of the horizontal NWs was attributed to unintentional guided growth determined by the roughness of the substrates' surface. This study provides an insight for a better understanding of the evolution of epitaxial horizontal NWs, especially for the growth direction/orientation.

摘要

外延水平纳米线(NWs)因其易于大规模集成而备受关注。从已报道的文献来看,外延生长通常是由纳米线与衬底之间的应变最小化驱动的,这种应变最小化与特定的晶体取向共同决定生长过程。在此,我们报道了通过表面导向的气-液-固生长法首次实现水平氮化镓纳米线的同质外延生长。这些纳米线沿着六个对称等效的〈1-100〉(m轴)方向生长,呈现出随机的60°/120°扭折构型。由于同质外延生长,可以消除应变。根据所得结果,我们认为水平纳米线的形成及其生长方向/取向与应变最小化并无直接关联。为理解外延水平纳米线的排列,我们提出了基于外延关系和潜在低指数生长取向的一般规则。据推断,水平纳米线的扭折归因于由衬底表面粗糙度决定的无意引导生长。本研究为更好地理解外延水平纳米线的演变,特别是其生长方向/取向,提供了一个视角。

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