Center for X-ray Analytics, Department Materials Meet Life, Swiss Federal Laboratories for Material Science and Technology, Empa, Überlandstrasse 129, Dübendorf, Switzerland.
J Microsc. 2021 May;282(2):123-135. doi: 10.1111/jmi.12986. Epub 2021 Jan 6.
In-line, or propagation-based phase-contrast X-ray imaging (PBI) is an attractive alternative to the attenuation-based modality for low-density, soft samples showing low attenuation contrast. With the growing availability of micro- and nano-focus X-ray tubes, the method is increasingly applied in the laboratory. Here, we discuss the technique and demonstrate its advantages for selected low-density, low attenuation material samples using a lab-based micro- and nano-computed tomography systems Easytom XL Ultra, providing micron and sub-micron range resolution PBI images. We demonstrate a multi-step optimization of the lab-based PBI technique on our scanner that includes choosing the optimal detector-source hardware combination available in the setup, then optimizing the imaging geometry and finally the phase retrieval process through a parametric study. We point out and elaborate on the effect of noise correlation and texturing due to phase retrieval. We demonstrate the overall benefits of using the phase image and the phase retrieval for the selected samples such as improved image quality, increased contrast-to-noise ratio while only marginally influencing the spatial resolution. The improvement in image quality also enables further image processing steps for detailed structural analysis of the samples, which would be much more complicated if not impossible based on the transmission image.
线内或基于传播的相衬 X 射线成像(PBI)是一种有吸引力的替代衰减成像的方法,适用于显示低衰减对比度的低密度、软样本。随着微焦点和纳米焦点 X 射线管的日益普及,该方法在实验室中越来越多地得到应用。在这里,我们讨论了这项技术,并使用基于实验室的微纳计算机断层扫描系统 Easytom XL Ultra 对选定的低密度、低衰减材料样本进行了演示,提供了微米和亚微米范围的分辨率 PBI 图像。我们展示了对我们的扫描仪上的基于实验室的 PBI 技术的多步骤优化,包括选择设置中可用的最佳探测器-源硬件组合,然后优化成像几何结构,最后通过参数研究优化相位检索过程。我们指出并详细阐述了由于相位检索而导致的噪声相关性和纹理的影响。我们展示了对选定样本使用相位图像和相位检索的整体优势,例如提高图像质量、增加对比度噪声比,而对空间分辨率的影响很小。图像质量的提高还为样品的详细结构分析提供了进一步的图像处理步骤,如果基于透射图像,这些步骤将更加复杂,甚至不可能。