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用于电子和机械部件缺陷分析的熵产生方法综述

Entropy Generation Methodology for Defect Analysis of Electronic and Mechanical Components-A Review.

作者信息

Cai Miao, Cui Peng, Qin Yikang, Geng Daoshuang, Wei Qiqin, Wang Xiyou, Yang Daoguo, Zhang Guoqi

机构信息

School of Mechanical and Electrical Engineering, Guilin University of Electronic Technology, Guilin 541004, China.

Delft Institute of Microsystems and Nanoelectronics (Dimes), Delft University of Technology, 2628CD Delft Mekelweg 6, The Netherlands.

出版信息

Entropy (Basel). 2020 Feb 23;22(2):254. doi: 10.3390/e22020254.

DOI:10.3390/e22020254
PMID:33286028
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC7516701/
Abstract

Understanding the defect characterization of electronic and mechanical components is a crucial step in diagnosing component lifetime. Technologies for determining reliability, such as thermal modeling, cohesion modeling, statistical distribution, and entropy generation analysis, have been developed widely. Defect analysis based on the irreversibility entropy generation methodology is favorable for electronic and mechanical components because the second law of thermodynamics plays a unique role in the analysis of various damage assessment problems encountered in the engineering field. In recent years, numerical and theoretical studies involving entropy generation methodologies have been carried out to predict and diagnose the lifetime of electronic and mechanical components. This work aimed to review previous defect analysis studies that used entropy generation methodologies for electronic and mechanical components. The methodologies are classified into two categories, namely, damage analysis for electronic devices and defect diagnosis for mechanical components. Entropy generation formulations are also divided into two detailed derivations and are summarized and discussed by combining their applications. This work is expected to clarify the relationship among entropy generation methodologies, and benefit the research and development of reliable engineering components.

摘要

了解电子和机械部件的缺陷特征是诊断部件寿命的关键步骤。用于确定可靠性的技术,如热建模、内聚建模、统计分布和熵产生分析,已得到广泛发展。基于不可逆熵产生方法的缺陷分析对电子和机械部件有利,因为热力学第二定律在分析工程领域遇到的各种损伤评估问题中起着独特作用。近年来,已经开展了涉及熵产生方法的数值和理论研究,以预测和诊断电子和机械部件的寿命。这项工作旨在回顾以前使用熵产生方法对电子和机械部件进行缺陷分析的研究。这些方法分为两类,即电子设备的损伤分析和机械部件的缺陷诊断。熵产生公式也分为两个详细的推导,并结合其应用进行总结和讨论。这项工作有望阐明熵产生方法之间的关系,并有利于可靠工程部件的研发。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/6b29d9a89a62/entropy-22-00254-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/b5dcf52f294a/entropy-22-00254-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/968678f85a07/entropy-22-00254-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/2befe459561c/entropy-22-00254-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/a27a3f56a2f2/entropy-22-00254-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/6b29d9a89a62/entropy-22-00254-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/b5dcf52f294a/entropy-22-00254-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/968678f85a07/entropy-22-00254-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/2befe459561c/entropy-22-00254-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/a27a3f56a2f2/entropy-22-00254-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/fd38/7516701/6b29d9a89a62/entropy-22-00254-g005.jpg

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本文引用的文献

1
The Generated Entropy Monitored by Pyroelectric Sensors.热释电传感器监测的产生熵。
Sensors (Basel). 2018 Oct 3;18(10):3320. doi: 10.3390/s18103320.
2
Beyond the classical theory of heat conduction: a perspective view of future from entropy.超越经典热传导理论:从熵的角度看未来
Proc Math Phys Eng Sci. 2016 Oct;472(2194):20160362. doi: 10.1098/rspa.2016.0362.