Fuhrmann Marc, Musyanovych Anna, Thoelen Ronald, von Bomhard Sibylle, Möbius Hildegard
Department of Computer Sciences/Micro Systems Technology, University of Applied Sciences Kaiserslautern, Amerika Str. 1, 66482 Zweibrücken, Germany.
Nanoparticle Technology Department, Fraunhofer IMM, Carl-Zeiss-Str. 18-20, 55129 Mainz, Germany.
Nanomaterials (Basel). 2020 Dec 11;10(12):2486. doi: 10.3390/nano10122486.
Encapsulated magnetic nanoparticles are of increasing interest for biomedical applications. However, up to now, it is still not possible to characterize their localized magnetic properties within the capsules. Magnetic Force Microscopy (MFM) has proved to be a suitable technique to image magnetic nanoparticles at ambient conditions revealing information about the spatial distribution and the magnetic properties of the nanoparticles simultaneously. However, MFM measurements on magnetic nanoparticles lead to falsifications of the magnetic MFM signal due to the topographic crosstalk. The origin of the topographic crosstalk in MFM has been proven to be capacitive coupling effects due to distance change between the substrate and tip measuring above the nanoparticle. In this paper, we present data fusion of the topography measurements of Atomic Force Microscopy (AFM) and the phase image of MFM measurements in combination with the theory of capacitive coupling in order to eliminate the topographic crosstalk in the phase image. This method offers a novel approach for the magnetic visualization of encapsulated magnetic nanoparticles.
封装的磁性纳米颗粒在生物医学应用中越来越受到关注。然而,到目前为止,仍然无法表征它们在胶囊内的局部磁性。磁力显微镜(MFM)已被证明是一种在环境条件下对磁性纳米颗粒进行成像的合适技术,它能同时揭示有关纳米颗粒空间分布和磁性的信息。然而,由于形貌串扰,对磁性纳米颗粒进行MFM测量会导致磁性MFM信号失真。MFM中形貌串扰的起源已被证明是由于在纳米颗粒上方测量时,基底与探针之间距离变化引起的电容耦合效应。在本文中,我们结合电容耦合理论,展示了原子力显微镜(AFM)形貌测量与MFM测量相位图像的数据融合,以消除相位图像中的形貌串扰。该方法为封装磁性纳米颗粒的磁性可视化提供了一种新途径。