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夹心结构聚偏氟乙烯复合薄膜高介电性能中介电行为的自由体积依赖性

Free volume dependence of dielectric behaviour in sandwich-structured high dielectric performances of poly(vinylidene fluoride) composite films.

作者信息

Yang Lei, Yang Lanqiong, Ma Kun, Wang Yu, Song Tong, Gong Liliang, Sun Jian, Zhao Ling, Yang Zhihong, Xu Jianmei, Wang Qing, Li Guogang, Zhou Wei

机构信息

Faculty of Materials Science and Chemistry, China University of Geosciences, Wuhan 430074, China.

出版信息

Nanoscale. 2021 Jan 7;13(1):300-310. doi: 10.1039/d0nr06070d. Epub 2020 Dec 18.

Abstract

A dielectric film with a trilayer structure is fabricated to obtain both a high dielectric constant and superior electrical breakdown strength simultaneously. The outer layers of the trilayered composite film are composed of barium titanate (BTO) particles dispersed in poly(vinylidene fluoride) (PVDF) to ensure a relatively high dielectric constant, while the central layer of the composite film consists of exfoliated hexagonal boron nitride nanosheets (BNNS) dispersed in PVDF to provide high electrical breakdown strength. Compared with pristine PVDF, the dielectric constant and breakdown strength are simultaneously enhanced due to the sandwich structure, and the dielectric loss is maintained at a low level. Most important of all, positron annihilation lifetime spectroscopy (PALS) is applied to study the atomic-scale free volume holes of PVDF composite films and the effect of free volume holes on the dielectric constant and breakdown strength. Results show that the size of free volume holes of PVDF increased with the addition of BTO, but it decreased firstly and then increased with the BNNS loading. The correlation between dielectric properties and the size of free volume holes of the PVDF matrix was discussed in each layer. It is illustrated that the experimental dielectric constant of the PVDF/BTO single-layered film is consistent with the theoretical value at a lower BTO loading but smaller than the theoretical value at a higher BTO loading, which is probably ascribed to the increased size of free volume holes. The breakdown strength of the PVDF/BNNS film increased with the introduction of BNNS and the reduced size of free volume holes, which is ascribed to the reduced partial discharge phenomenon. The atomic-scale microstructure analysis based on free volume holes provides valuable ideas and new understanding for the study of the mechanism of the dielectric behaviour of polymer composites.

摘要

制备了具有三层结构的介电薄膜,以同时获得高介电常数和优异的电击穿强度。三层复合薄膜的外层由分散在聚偏氟乙烯(PVDF)中的钛酸钡(BTO)颗粒组成,以确保相对较高的介电常数,而复合薄膜的中间层由分散在PVDF中的片状六方氮化硼纳米片(BNNS)组成,以提供高电击穿强度。与原始PVDF相比,由于三明治结构,介电常数和击穿强度同时提高,并且介电损耗保持在较低水平。最重要的是,采用正电子湮没寿命谱(PALS)研究了PVDF复合薄膜的原子尺度自由体积空穴以及自由体积空穴对介电常数和击穿强度的影响。结果表明,PVDF的自由体积空穴尺寸随BTO的添加而增大,但随BNNS含量的增加先减小后增大。讨论了各层中PVDF基体的介电性能与自由体积空穴尺寸之间的相关性。结果表明,在较低BTO含量下,PVDF/BTO单层薄膜的实验介电常数与理论值一致,但在较高BTO含量下小于理论值,这可能归因于自由体积空穴尺寸的增大。PVDF/BNNS薄膜的击穿强度随着BNNS的引入和自由体积空穴尺寸的减小而增加,这归因于局部放电现象的减少。基于自由体积空穴的原子尺度微观结构分析为研究聚合物复合材料介电行为机理提供了有价值的思路和新的认识。

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