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探索电极驱动的硅量子点系统的行为:从电荷控制到量子比特操作。

Exploring the behaviors of electrode-driven Si quantum dot systems: from charge control to qubit operations.

作者信息

Kang Ji-Hoon, Ryu Junghee, Ryu Hoon

机构信息

Division of National Supercomputing, Korea Institute of Science and Technology Information, Daejeon 34141, Republic of Korea.

出版信息

Nanoscale. 2021 Jan 7;13(1):332-339. doi: 10.1039/d0nr05070a. Epub 2020 Dec 21.

DOI:10.1039/d0nr05070a
PMID:33346301
Abstract

Charge stabilities and spin-based quantum bit (qubit) operations in Si double quantum dot (DQD) systems, whose confinement potentials are controlled with multiple gate electrodes, are theoretically studied with a multi-scale modeling approach that combines electronic structure simulations and the Thomas-Fermi method. Taking Si/SiGe heterostructures as the target of modeling, this work presents an in-depth discussion on the designs of electron reservoirs, electrostatic controls of quantum dot (QD) shapes and their corresponding charge confinements, and spin qubit manipulations. The effects of unintentional inaccuracies in DC control biases and geometric symmetries on the Rabi cycle of spin qubits are investigated to examine the robustness of logic operations. Solid connections to the latest experimental results are also established to validate the simulation method. As a rare modeling study that explores the full-stack functionality of Si DQD structures as quantum logic gate devices, this work delivers the knowledge of engineering details that are not uncovered by the latest experimental work and can serve as a basic but practical guideline for potential device designs.

摘要

利用结合电子结构模拟和托马斯 - 费米方法的多尺度建模方法,对硅双量子点(DQD)系统中的电荷稳定性和基于自旋的量子比特(qubit)操作进行了理论研究,该系统的限制势由多个栅电极控制。以Si/SiGe异质结构作为建模目标,本文深入讨论了电子库的设计、量子点(QD)形状的静电控制及其相应的电荷限制,以及自旋量子比特操纵。研究了直流控制偏置和几何对称性中的无意误差对自旋量子比特拉比循环的影响,以检验逻辑操作的稳健性。还建立了与最新实验结果的可靠联系,以验证模拟方法。作为一项探索硅DQD结构作为量子逻辑门器件的全栈功能的罕见建模研究,本文提供了最新实验工作未揭示的工程细节知识,并可为潜在的器件设计提供基本但实用的指导。

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Nanoscale. 2021 Jan 7;13(1):332-339. doi: 10.1039/d0nr05070a. Epub 2020 Dec 21.
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Devitalizing noise-driven instability of entangling logic in silicon devices with bias controls.
通过偏置控制使硅器件中纠缠逻辑的非稳态噪声驱动不稳定性失活。
Sci Rep. 2022 Sep 7;12(1):15200. doi: 10.1038/s41598-022-19404-0.