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硫 Kβ X 射线发射光谱法:与硫 K 边 X 射线吸收光谱法比较,用于有机硫化合物的形态分析。

Sulfur Kβ X-ray emission spectroscopy: comparison with sulfur K-edge X-ray absorption spectroscopy for speciation of organosulfur compounds.

机构信息

Stanford Synchrotron Radiation Lightsource, SLAC National Accelerator Laboratory, Stanford University, Menlo Park, California 94025, USA.

出版信息

Phys Chem Chem Phys. 2021 Feb 28;23(8):4500-4508. doi: 10.1039/d0cp05323f. Epub 2020 Dec 23.

Abstract

Until recently, sulfur was known as a "spectroscopically silent" element because of a paucity of convenient spectroscopic probes suitable for in situ chemical speciation. In recent years the technique of sulfur K-edge X-ray absorption spectroscopy (XAS) has been used extensively in sulfur speciation in a variety of different fields. With an initial focus on reduced forms of organic sulfur, we have explored a complementary X-ray based spectroscopy - sulfur Kβ X-ray emission spectroscopy (XES) - as a potential analytical tool for sulfur speciation in complex samples. We compare and contrast the sensitivity of sulfur Kβ XES with that of sulfur K-edge XAS, and find differing sensitivities for the two techniques. In some cases an approach involving both sulfur K-edge XAS and sulfur Kβ XES may be a powerful combination for deducing sulfur speciation in samples containing complex mixtures.

摘要

直到最近,由于缺乏适合原位化学形态分析的方便光谱探针,硫一直被称为“光谱静默”元素。近年来,硫 K 边 X 射线吸收光谱(XAS)技术已广泛应用于各种不同领域的硫形态分析。最初的重点是有机硫的还原形式,我们探索了一种基于 X 射线的互补光谱技术 - 硫 Kβ X 射线发射光谱(XES) - 作为复杂样品中硫形态分析的潜在分析工具。我们比较和对比了硫 Kβ XES 与硫 K 边 XAS 的灵敏度,发现两种技术的灵敏度不同。在某些情况下,涉及硫 K 边 XAS 和硫 Kβ XES 的方法可能是推断含有复杂混合物的样品中硫形态的有力组合。

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