Nonuniform Electric Field-Enhanced In-Source Declustering in High-Pressure Photoionization/Photoionization-Induced Chemical Ionization Mass Spectrometry for Operando Catalytic Reaction Monitoring.

Photoionization mass spectrometry (PI-MS) is a powerful and highly sensitive analytical technique for online monitoring of volatile organic compounds (VOCs). However, due to the large difference of PI cross sections for different compounds and the limitation of photon energy, the ability of lamp-based PI-MS for detection of compounds with low PI cross sections and high ionization energies (IEs) is insufficient. Although the ion production rate can be improved by elevating the ion source pressure, the problem of generating plenty of cluster ions, such as [MH]·(HO) ( = 1 and 2) and [M], needs be solved. In this work, we developed a new nonuniform electric field high-pressure photoionization/photoionization-induced chemical ionization (NEF-HPPI/PICI) source with the abilities of both HPPI and PICI, which was accomplished through ion-molecule reactions with high-intensity HO reactant ions generated by photoelectron ionization (PEI) of water molecules. By establishing a nonuniform electric field in a three-zone ionization region to enhance in-source declustering and using 99.999% helium as the carrier gas, not only the formation of cluster ions was significantly diminished, but the ion transmission efficiency was also improved. Consequently, the main characteristic ion for each analyte both in HPPI and PICI occupied more than 80%, especially [HCOOH·H] with a yield ratio of 99.2% for formic acid. The analytical capacity of this system was demonstrated by operando monitoring the hydrocarbons and oxygenated VOC products during the methanol-to-olefins and methane conversion catalytic reaction processes, exhibiting wide potential applications in process monitoring, reaction mechanism research, and online quality control.