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使用电子能量损失谱(EELS)和会聚束电子衍射(CBED)方法进行样品厚度测量的比较研究。

Comparative study on the specimen thickness measurement using EELS and CBED methods.

作者信息

Heo Yoon-Uk

机构信息

Graduate Institute of Ferrous Technology, Pohang University of Science and Technology, Cheongam-Ro 77, Hyoja dong, Pohang, 37-673, Republic of Korea.

出版信息

Appl Microsc. 2020 May 12;50(1):8. doi: 10.1186/s42649-020-00029-4.

Abstract

Two thickness measurement methods using an electron energy loss spectroscopy (EELS) and 10a convergent beam electron diffraction (CBED) were compared in an Fe-18Mn-0.7C alloy. The thin foil specimen was firstly tilted to satisfy 10a two-beam condition. Low loss spectra of EELS and CBED patterns were acquired in scanning transmission electron microscopy (STEM) and TEM-CBED modes under the two-beam condition. The log-ratio method was used for measuring the thin foil thickness. Kossel-Möllenstedt (K-M) fringe of the [Formula: see text] diffracted disk of austenite was analyzed to evaluate the thickness. The results prove the good coherency between both methods in the thickness range of 72 ~ 113 nm with a difference of less than 5%.

摘要

在一种Fe-18Mn-0.7C合金中,对使用电子能量损失谱(EELS)和10a会聚束电子衍射(CBED)的两种厚度测量方法进行了比较。首先倾斜薄箔试样以满足10a双束条件。在双束条件下,于扫描透射电子显微镜(STEM)和透射电子显微镜-会聚束电子衍射(TEM-CBED)模式下采集EELS的低损耗谱和CBED图案。采用对数比法测量薄箔厚度。分析奥氏体[公式:见原文]衍射盘的科塞尔-默伦施泰特(K-M)条纹以评估厚度。结果证明,在72~113nm的厚度范围内,两种方法具有良好的一致性,差异小于5%。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/0534/7818352/b5fac57b8a0c/42649_2020_29_Fig1_HTML.jpg

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