IEEE Trans Ultrason Ferroelectr Freq Control. 2021 Jun;68(6):2277-2293. doi: 10.1109/TUFFC.2021.3060094. Epub 2021 May 25.
Intelligent defect location algorithms based on the times-of-flight (ToFs) of Lamb waves are attractive for nondestructive testing (NDT) and structural health monitoring (SHM) of structures with large geometric sizes. Unlike the classical imaging algorithm based on projecting the amplitude information of scattering signals into a discrete spatial grid on the structure via their propagation characteristics, intelligent defect location algorithms are more efficient in specific applications. In our previous work, an intelligent algorithm for the location of defects in plates was proposed by considering the statistical, diversity, and fuzzy characteristics of the classical defect location algorithm. This approach can realize the efficient location of different defects under a suitable parameter selection. However, interfering components remain in the results, which decreases the detection resolution. Because the measurement uncertainty is directly related to the time, an optimized intelligent location algorithm is provided for the efficient defect location with Lamb waves and a sparse transducer array in this study. The defect position is identified with high resolution by analyzing the distribution of individuals. Several specific data and a fuzzy control parameter are introduced to the proposed algorithm. The K-means algorithm was adopted to realize the adaptive updating of individuals. The influence of parameter values on the detection results was analyzed. A combined analysis of the individuals was provided to ensure the detection robustness by eliminating the influence of fuzzy control parameters on the detection. Compared with the elliptic imaging algorithm, the intelligent defect location algorithm has higher location resolution and executes approximately 65 times faster.
基于兰姆波飞行时间 (ToF) 的智能缺陷定位算法对于具有较大几何尺寸的结构的无损检测 (NDT) 和结构健康监测 (SHM) 具有吸引力。与基于传播特性将散射信号的幅度信息通过投影到结构上的离散空间网格中的经典成像算法不同,智能缺陷定位算法在特定应用中更高效。在我们之前的工作中,通过考虑经典缺陷定位算法的统计、多样性和模糊特性,提出了一种用于板中缺陷定位的智能算法。这种方法可以在适当的参数选择下实现不同缺陷的高效定位。然而,结果中仍然存在干扰分量,这降低了检测分辨率。由于测量不确定性与时间直接相关,因此本研究为使用兰姆波和稀疏换能器阵列进行高效缺陷定位提供了优化的智能定位算法。通过分析个体的分布,可以以高分辨率识别缺陷位置。向提出的算法中引入了几个特定的数据和模糊控制参数。采用 K 均值算法实现个体的自适应更新。分析了参数值对检测结果的影响。通过组合分析个体,消除模糊控制参数对检测的影响,确保了检测的稳健性。与椭圆成像算法相比,智能缺陷定位算法具有更高的定位分辨率,执行速度大约快 65 倍。