Park Inkyung, Kim Minah, Lee Tae Young, Hwang Wu Jeong, Bin Kwak Yoo, Oh Sanghoon, Lho Silvia Kyungjin, Moon Sun-Young, Kwon Jun Soo
Department of Brain and Cognitive Sciences, Seoul National University College of Natural Sciences, Seoul, Republic of Korea.
Department of Psychiatry, Seoul National University College of Medicine, Seoul, Republic of Korea.
NPJ Schizophr. 2021 Mar 1;7(1):17. doi: 10.1038/s41537-021-00148-1.
Although abnormal cortical gyrification has been consistently reported in patients with schizophrenia, whether gyrification abnormalities reflect a genetic risk for the disorder remains unknown. This study investigated differences in cortical gyrification between unaffected relatives (URs) with high genetic loading for schizophrenia and healthy controls (HCs) to identify potential genetic vulnerability markers. A total of 50 URs of schizophrenia patients and 50 matched HCs underwent T1-weighted magnetic resonance imaging to compare whole-brain gyrification using the local gyrification index (lGI). Then, the lGI clusters showing significant differences were compared between the UR subgroups based on the number of first-degree relatives with schizophrenia to identify the effect of genetic loading on cortical gyrification changes. The URs exhibited significantly lower cortical gyrification than the HCs in clusters including medial parieto-occipital and cingulate regions comprising the bilateral precuneus, cuneus, pericalcarine, lingual, isthmus cingulate, and posterior cingulate gyri. Moreover, URs who had two or more first-degree relatives with schizophrenia showed greater gyrification reductions in these clusters than those who had at least one first-degree relative with schizophrenia. Our findings of reduced gyrification in URs, which are consistent with accumulated evidence of hypogyria observed in regions showing patient-control differences in previous studies, highlight that such hypogyria in posteromedial regions may serve as a genetic vulnerability marker and reflect early neurodevelopmental abnormalities resulting from a genetic risk for schizophrenia.
尽管在精神分裂症患者中一直有关于异常皮质脑回形成的报道,但脑回形成异常是否反映了该疾病的遗传风险仍不清楚。本研究调查了具有高精神分裂症遗传负荷的未患病亲属(URs)与健康对照(HCs)之间皮质脑回形成的差异,以确定潜在的遗传易感性标志物。总共50名精神分裂症患者的URs和50名匹配的HCs接受了T1加权磁共振成像,以使用局部脑回指数(lGI)比较全脑脑回形成。然后,根据患有精神分裂症的一级亲属数量,在UR亚组之间比较显示出显著差异的lGI簇,以确定遗传负荷对皮质脑回形成变化的影响。在包括内侧顶枕叶和扣带区的簇中,URs的皮质脑回形成明显低于HCs,这些区域包括双侧楔前叶、楔叶、距状裂周围、舌回、扣带峡部和后扣带回。此外,有两个或更多患有精神分裂症的一级亲属的URs在这些簇中的脑回减少比至少有一个患有精神分裂症的一级亲属的URs更大。我们在URs中发现脑回减少,这与先前研究中显示患者与对照差异的区域中观察到的脑回减少的累积证据一致,突出表明后内侧区域的这种脑回减少可能作为遗传易感性标志物,并反映由精神分裂症遗传风险导致的早期神经发育异常。