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Electrostatic image force energy for charges in three-layer structures: exact formulas and their approximations.

作者信息

Gabovich A M, Voitenko A I

机构信息

Institute of Physics, 46 Nauky Ave., Kyiv 03028, Ukraine.

出版信息

J Phys Condens Matter. 2021 Apr 28;33(20). doi: 10.1088/1361-648X/abeca5.

DOI:10.1088/1361-648X/abeca5
PMID:33684899
Abstract

The problem of image force energy() in three-layer plane structures, whereis the coordinate perpendicular to the layers, has been reconsidered. In the classical electrostatic limit, where the dielectric permittivitiesof all structure components (= 1, 2, 3) are constants, the exact general dependences() were obtained for each layer and any-combination in terms of the Lerch transcendent function. For certain combinations of, an ion adsorption minimum was found to arise in one of the covers far from the interlayer. Some other combinations ofcan lead to the appearance of a potential barrier, which does not permit a free charge existing in the cover to approach the interlayer, although it will be attracted to the interlayer in the close vicinity of the latter. For symmetric structures (=), the asymptotic behavior ofW(Z→∞)was shown to beZ-2rather thanZ-1, as it takes place in the two-layer case. Simple approximate analytical formulas that describe() and possess high accuracy for arbitrary relationships among the-constants were proposed.

摘要

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