Rostami S, Vazifehshenas T, Salavati-Fard T
Department of Physics, Shahid Beheshti University, G. C., Evin, Tehran 1983969411, Iran.
Department of Chemical and Biomolecular Engineering, University of Houston, Houston, TX 77204, United States of America.
J Phys Condens Matter. 2021 Apr 23;33(18). doi: 10.1088/1361-648X/abeebc.
We theoretically study the Coulomb drag resistivity and plasmon modes behavior for a system composed of two parallel-type doped GaS monolayers with Mexican-hat valence energy band using the Boltzmann transport theory formalism. We investigate the effect of temperature,, carrier density,, and layer separation,, on the plasmon modes and drag resistivity within the energy-independent scattering time approximation. Our results show that the density dependence of plasmon modes can be approximated by. Also, the calculations suggest aand adependencies for the acoustic and optical plasmon energies, respectively. Interestingly, we obtain that the behavior of drag resistivity in the double-layer metal monochalcogenides swings between the behavior of a double-quantum well system with parabolic dispersion and that of a double-quantum wire structure with a large carrier density of states. In particular, the transresistivity value reduces exponentially with increasing the distance between layers. Furthermore, the drag resistivity changes as/(/) at low (intermediate) temperatures. Finally, we compare the drag resistivity as a function of temperature for GaS with other Mexican-hat materials including GaSe and InSe and find that it adopts higher values when the metal monochalcogenide has smaller Mexican-hat height.
我们使用玻尔兹曼输运理论形式,从理论上研究了由两个具有墨西哥帽价带的平行型掺杂硫化镓单层组成的系统的库仑拖曳电阻率和等离激元模式行为。我们在与能量无关的散射时间近似下,研究了温度(T)、载流子密度(n)和层间距(d)对等离激元模式和拖曳电阻率的影响。我们的结果表明,等离激元模式的密度依赖性可以近似为(\cdots)。此外,计算结果分别表明了声学和光学等离激元能量对(n)和(d)的依赖性。有趣的是,我们发现双层金属硫属化物中的拖曳电阻率行为在具有抛物线色散的双量子阱系统和具有大态密度的双量子线结构的行为之间摆动。特别是,跨电阻率值随着层间距离的增加而指数下降。此外,在低温(中温)下,拖曳电阻率随(T^{2}/(T + \Theta))变化。最后,我们将硫化镓的拖曳电阻率作为温度的函数与其他包括硒化镓和硒化铟在内的墨西哥帽材料进行了比较,发现当金属硫属化物的墨西哥帽高度较小时,它具有更高的值。