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电化学事件的透射电子显微镜研究:偏置和电子束对电化学的影响。

TEM of Electrochemical Incidents: Effects of Biasing and Electron Beam on Electrochemistry.

作者信息

Han Chaoya, Islam Md Tariqul, Ni Chaoying

机构信息

Department of Materials Science and Engineering, University of Delaware, Newark, Delaware 19716, United States.

出版信息

ACS Omega. 2021 Mar 2;6(10):6537-6546. doi: 10.1021/acsomega.0c05829. eCollection 2021 Mar 16.

Abstract

TEM utilizing specialized holders and MEMS chips allows the investigation of the interaction, evolution, property, and function of nanostructures and devices responding to designed environments and/or stimuli. This mini-review summarizes the recent progress of TEM with a liquid cell and a flow channel for the investigation of interactions among aqueous nanoparticles, electrolytes, and electrodes under the influence of electric bias and electron beam. A focus is made on nanoparticle growth by electrodeposition, particle nucleation induced by electric biasing or electron beam, self-assembly, and electrolyte breakdown. We also outline some future opportunities of TEM with aqueous cells and flow.

摘要

利用专门的样品杆和微机电系统芯片的透射电子显微镜(TEM)能够研究纳米结构和器件在响应特定环境和/或刺激时的相互作用、演变、性质及功能。本综述总结了配备液体池和流动通道的TEM在研究电偏压和电子束影响下水相纳米颗粒、电解质和电极之间相互作用方面的最新进展。重点关注通过电沉积实现的纳米颗粒生长、电偏压或电子束诱导的颗粒成核、自组装以及电解质击穿。我们还概述了配备水相池和流动装置的TEM未来的一些机遇。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/ada4/7970484/441f03a62926/ao0c05829_0004.jpg

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