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关于增材制造晶格结构中残余应力的测定

On the determination of residual stresses in additively manufactured lattice structures.

作者信息

Fritsch Tobias, Sprengel Maximilian, Evans Alexander, Farahbod-Sternahl Lena, Saliwan-Neumann Romeo, Hofmann Michael, Bruno Giovanni

机构信息

Bundesanstalt für Materialforschung und -prüfung (BAM), Unter den Eichen 87, 12205 Berlin, Germany.

Siemens Energy GmbH & Co. KG, Huttenstrasse 12, 10553 Berlin, Germany.

出版信息

J Appl Crystallogr. 2021 Feb 1;54(Pt 1):228-236. doi: 10.1107/S1600576720015344.

Abstract

The determination of residual stresses becomes more complicated with increasing complexity of the structures investigated. Additive manufacturing techniques generally allow the production of 'lattice structures' without any additional manufacturing step. These lattice structures consist of thin struts and are thus susceptible to internal stress-induced distortion and even cracks. In most cases, internal stresses remain locked in the structures as residual stress. The determination of the residual stress in lattice structures through nondestructive neutron diffraction is described in this work. It is shown how two difficulties can be overcome: () the correct alignment of the lattice structures within the neutron beam and () the correct determination of the residual stress field in a representative part of the structure. The magnitude and the direction of residual stress are discussed. The residual stress in the strut was found to be uniaxial and to follow the orientation of the strut, while the residual stress in the knots was more hydro-static. Additionally, it is shown that strain measurements in at least seven independent directions are necessary for the estimation of the principal stress directions. The measurement directions should be chosen according to the sample geometry and an informed choice on the possible strain field. If the most prominent direction is not measured, the error in the calculated stress magnitude increases considerably.

摘要

随着所研究结构复杂性的增加,残余应力的测定变得更加复杂。增材制造技术通常允许在无需任何额外制造步骤的情况下生产“晶格结构”。这些晶格结构由细支柱组成,因此容易受到内应力引起的变形甚至开裂的影响。在大多数情况下,内应力作为残余应力保留在结构中。本文描述了通过无损中子衍射测定晶格结构中的残余应力。展示了如何克服两个困难:()晶格结构在中子束内的正确对准和()结构代表性部分中残余应力场的正确测定。讨论了残余应力的大小和方向。发现支柱中的残余应力是单轴的,并遵循支柱的方向,而节点中的残余应力更具静水压力性质。此外,结果表明,为了估计主应力方向,至少需要在七个独立方向上进行应变测量。测量方向应根据样品几何形状以及对可能应变场的明智选择来确定。如果未测量最突出的方向,计算出的应力大小误差会大幅增加。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/1561/7941307/c58e7c7bea2c/j-54-00228-fig1.jpg

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