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用于材料研究的原位透射电子显微镜和原子力显微镜

In Situ TEM and AFM for Investigation of Materials.

作者信息

Lamberti Luciano

机构信息

Dipartimento di Meccanica, Matematica e Management, Politecnico di Bari, 70125 Bari, Italy.

出版信息

Materials (Basel). 2021 Apr 23;14(9):2140. doi: 10.3390/ma14092140.

Abstract

Materials can be considered the backbone of all technological applications [...].

摘要

材料可被视为所有技术应用的支柱[...]。

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本文引用的文献

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Atomic force microscope.
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