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原位 X 射线技术在电化学界面中的应用。

In Situ X-Ray Techniques for Electrochemical Interfaces.

机构信息

Oliver Lodge Laboratory, Department of Physics, University of Liverpool, Liverpool L69 7ZE, United Kingdom; email:

出版信息

Annu Rev Anal Chem (Palo Alto Calif). 2021 Jul 27;14(1):87-107. doi: 10.1146/annurev-anchem-091020-100631.

Abstract

This article reviews progress in the study of materials using X-ray-based techniques from an electrochemistry perspective. We focus on in situ/in operando surface X-ray scattering, X-ray absorption spectroscopy, and the combination of both methods. The background of these techniques together with key concepts is introduced. Key examples of in situ and in operando investigation of liquid-solid and liquid-liquid interfaces are presented. X-ray scattering and spectroscopy have helped to develop an understanding of the underlying atomic and molecular processes associated with electrocatalysis, electrodeposition, and battery materials. We highlight recent developments, including resonant surface diffraction and time-resolved studies.

摘要

本文从电化学角度综述了基于 X 射线技术的材料研究进展。我们重点关注原位/operando 表面 X 射线散射、X 射线吸收光谱以及这两种方法的结合。介绍了这些技术的背景和关键概念。展示了液体-固体和液体-液体界面的原位和 operando 研究的关键实例。X 射线散射和光谱学有助于理解与电催化、电沉积和电池材料相关的基础原子和分子过程。我们强调了包括共振表面衍射和时间分辨研究在内的最新进展。

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