• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

一种提高功率发光二极管结温直接测量精度的技术。

A Technique for Improving the Precision of the Direct Measurement of Junction Temperature in Power Light-Emitting Diodes.

作者信息

Iero Demetrio, Merenda Massimo, Carotenuto Riccardo, Pangallo Giovanni, Rao Sandro, Brezeanu Gheorghe, Corte Francesco G Della

机构信息

Department of Information Engineering, Infrastructure and Sustainable Energy (DIIES), Mediterranea University of Reggio Calabria, 89124 Reggio Calabria, Italy.

HWA srl-Spin Off dell'Università Mediterranea di Reggio Calabria, Via Reggio Campi II tr. 135, 89126 Reggio Calabria, Italy.

出版信息

Sensors (Basel). 2021 Apr 29;21(9):3113. doi: 10.3390/s21093113.

DOI:10.3390/s21093113
PMID:33947028
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC8124380/
Abstract

Extending the lifetime of power light-emitting diodes (LEDs) is achievable if proper control methods are implemented to reduce the side effects of an excessive junction temperature, . The accuracy of state-of-the-art LED junction temperature monitoring techniques is negatively affected by several factors, such as the use of external sensors, calibration procedures, devices aging, and technological diversity among samples with the same part number. Here, a novel method is proposed, indeed based on the well-known technique consisting in tracking the LED forward voltage drop when a fixed forward current is imposed but exploiting the voltage variation with respect to room temperature. This method, which limits the effects of sample heterogeneity, is applied to a set of ten commercial devices. The method led to an effective reduction of the measurement error, which was below 1 °C.

摘要

如果实施适当的控制方法以减少过高结温的副作用,那么延长功率发光二极管(LED)的使用寿命是可以实现的。最先进的LED结温监测技术的准确性受到多种因素的负面影响,例如外部传感器的使用、校准程序、器件老化以及相同部件编号的样品之间的技术差异。在此,提出了一种新颖的方法,该方法实际上基于一种众所周知的技术,即在施加固定正向电流时跟踪LED的正向电压降,但利用相对于室温的电压变化。这种方法限制了样品异质性的影响,并应用于一组十个商用器件。该方法有效降低了测量误差,误差低于1°C。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/708dbd76ac92/sensors-21-03113-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/e4eacbdd994d/sensors-21-03113-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/c103063c16bf/sensors-21-03113-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/e9956da25ac5/sensors-21-03113-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/fd0aced10b51/sensors-21-03113-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/708dbd76ac92/sensors-21-03113-g005.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/e4eacbdd994d/sensors-21-03113-g001.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/c103063c16bf/sensors-21-03113-g002.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/e9956da25ac5/sensors-21-03113-g003.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/fd0aced10b51/sensors-21-03113-g004.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/9797/8124380/708dbd76ac92/sensors-21-03113-g005.jpg

相似文献

1
A Technique for Improving the Precision of the Direct Measurement of Junction Temperature in Power Light-Emitting Diodes.一种提高功率发光二极管结温直接测量精度的技术。
Sensors (Basel). 2021 Apr 29;21(9):3113. doi: 10.3390/s21093113.
2
A Critical Review on the Junction Temperature Measurement of Light Emitting Diodes.发光二极管结温测量的批判性综述
Micromachines (Basel). 2022 Sep 27;13(10):1615. doi: 10.3390/mi13101615.
3
Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test.热加速可靠性测试中白光发光二极管的结温分析及光通量衰减修正
Appl Opt. 2016 Aug 1;55(22):5909-16. doi: 10.1364/AO.55.005909.
4
Dynamic junction temperature measurement for high power light emitting diodes.大功率发光二极管的动态结温测量
Rev Sci Instrum. 2011 Aug;82(8):084904. doi: 10.1063/1.3624699.
5
Junction temperature measurement of light emitting diode by electroluminescence.通过电致发光测量发光二极管的结温
Rev Sci Instrum. 2011 Dec;82(12):123101. doi: 10.1063/1.3664619.
6
[Effect of Junction Temperature on EL Spectra of GaN-Based White High Voltage LEDs].[结温对基于氮化镓的白色高压发光二极管电致发光光谱的影响]
Guang Pu Xue Yu Guang Pu Fen Xi. 2017 Jan;37(1):37-41.
7
Cryostat setup for measuring spectral and electrical properties of light-emitting diodes at junction temperatures from 81 K to 297 K.用于在81 K至297 K的结温下测量发光二极管光谱和电学特性的低温恒温器装置。
Rev Sci Instrum. 2020 Jan 1;91(1):015106. doi: 10.1063/1.5125319.
8
Measurement of Physical Parameters and Development of a Light Emitting Diodes Device for Therapeutic Use.物理参数的测量和用于治疗用途的发光二极管设备的开发。
J Med Syst. 2020 Mar 12;44(4):88. doi: 10.1007/s10916-020-01557-y.
9
Sensor fabrication method for in situ temperature and humidity monitoring of light emitting diodes.用于监测发光二极管原位温度和湿度的传感器制造方法。
Sensors (Basel). 2010;10(4):3363-3372. doi: 10.3390/s100403363. Epub 2010 Apr 7.
10
Review of Low-Frequency Noise Properties of High-Power White LEDs during Long-Term Aging.高功率白光发光二极管长期老化过程中的低频噪声特性综述
Materials (Basel). 2021 Dec 21;15(1):13. doi: 10.3390/ma15010013.

引用本文的文献

1
A Critical Review on the Junction Temperature Measurement of Light Emitting Diodes.发光二极管结温测量的批判性综述
Micromachines (Basel). 2022 Sep 27;13(10):1615. doi: 10.3390/mi13101615.
2
Monitoring Junction Temperature of RF MOSFET under Its Working Condition Using Fiber Bragg Grating.基于光纤布拉格光栅监测射频金属氧化物半导体场效应晶体管工作状态下的结温
Micromachines (Basel). 2022 Mar 18;13(3):463. doi: 10.3390/mi13030463.

本文引用的文献

1
60-700 K CTAT and PTAT Temperature Sensors with 4H-SiC Schottky Diodes.采用4H-SiC肖特基二极管的60 - 700K CTAT和PTAT温度传感器。
Sensors (Basel). 2021 Jan 31;21(3):942. doi: 10.3390/s21030942.
2
High power visible light emitting diodes as pulsed excitation sources for biomedical photoacoustics.高功率可见光发光二极管作为生物医学光声成像的脉冲激发源。
Biomed Opt Express. 2016 Mar 14;7(4):1260-70. doi: 10.1364/BOE.7.001260. eCollection 2016 Apr 1.