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作为场发射理论敏感测试参数的指数前电压指数。

The pre-exponential voltage-exponent as a sensitive test parameter for field emission theories.

作者信息

Forbes R G, Popov E O, Kolosko A G, Filippov S V

机构信息

Advanced Technology Institute and Department of Electrical and Electronic Engineering, University of Surrey, Guildford, Surrey GU2 7XH, UK.

Ioffe Institute, ul. Politekhnicheskaya 26, Saint Petersburg 194021, Russia.

出版信息

R Soc Open Sci. 2021 Mar 10;8(3):201986. doi: 10.1098/rsos.201986.

Abstract

For field electron emission (FE), an empirical equation for measured current as a function of measured voltage has the form = exp[-/ ], where is a constant and and are constants or vary weakly with . Values for can be extracted (i) from simulations based on some specific FE theory, and in principle (ii) from current-voltage measurements of sufficiently high quality. This paper shows that a comparison of theoretically derived and experimentally derived values could provide a sensitive and useful tool for comparing FE theory and experiment, and for choosing between alternative theories. Existing methods of extracting -values from experimental or simulated current-voltage data are discussed, including a modernized 'least residual' method, and existing knowledge concerning -values is summarized. Exploratory simulations are reported. Where an analytical result for is independently known, this value is reliably extracted. More generally, extracted -values are sensitive to details of the emission theory used, but also depend on assumed emitter shape; these two influences will need to be disentangled by future research, and a range of emitter shapes will need examination. Other procedural conclusions are reported. Some scientific issues that this new tool may eventually be able to help investigate are indicated.

摘要

对于场电子发射(FE),测量电流作为测量电压的函数的经验方程具有形式(I = I_0 \exp[-(V_0/V)^{1/n}]),其中(I_0)是一个常数,(V_0)和(n)是常数或随(V)微弱变化。(n)的值可以(i)从基于某些特定场发射理论的模拟中提取,原则上(ii)从足够高质量的电流 - 电压测量中提取。本文表明,理论推导值与实验推导值的比较可以为比较场发射理论与实验以及在替代理论之间进行选择提供一个灵敏且有用的工具。讨论了从实验或模拟电流 - 电压数据中提取(n)值的现有方法,包括一种现代化的“最小残差”方法,并总结了关于(n)值的现有知识。报告了探索性模拟。在(n)的解析结果独立已知的情况下,可以可靠地提取该值。更一般地,提取的(n)值对所使用的发射理论细节敏感,但也取决于假定的发射极形状;这两种影响需要未来的研究加以区分,并且需要研究一系列发射极形状。还报告了其他程序结论。指出了这个新工具最终可能有助于研究的一些科学问题。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/31c5/8074945/765982a7016b/rsos201986f01.jpg

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