Hu Huiqin, Ren Xinyi, Wen Zhaoyang, Li Xingtong, Liang Yan, Yan Ming, Wu E
State Key Laboratory of Precision Spectroscopy, East China Normal University, Shanghai 200241, China.
Shanghai Key Laboratory of Modern Optical System, University of Shanghai for Science and Technology, Shanghai 200093, China.
Nanomaterials (Basel). 2021 May 24;11(6):1379. doi: 10.3390/nano11061379.
We propose and experimentally demonstrate single-pixel photon counting imaging based on dual-comb interferometry at 1550 nm. Different from traditional dual-comb imaging, this approach enables imaging at the photon-counting regime by using single-photon detectors combined with a time-correlated single-photon counter to record the returning photons. The illumination power is as low as 14 pW, corresponding to 2.2 × 10 photons/pulse. The lateral resolution is about 50 μm. This technique paves the way for applying dual-comb in remote sensing and imaging.
我们提出并通过实验证明了基于1550纳米双梳干涉测量法的单像素光子计数成像。与传统双梳成像不同，这种方法通过使用单光子探测器结合时间相关单光子计数器来记录返回光子，从而能够在光子计数模式下进行成像。照明功率低至14皮瓦，对应于2.2×10个光子/脉冲。横向分辨率约为50微米。这项技术为双梳在遥感和成像中的应用铺平了道路。
