Nations M, Gupta D, Sweeney J, Frausto L, Tobin M
TAE Technologies, Rancho Santa Margarita, California 92688, USA.
Rev Sci Instrum. 2021 May 1;92(5):053512. doi: 10.1063/5.0043838.
In TAE Technologies' C-2W experiment, electrode biasing is utilized for boundary control of a field-reversed configuration (FRC) plasma embedded in a magnetic mirror. Understanding the underlying physics associated with FRC rotation, stabilization, and heating is crucial for improving machine performance. Impurity ion rotation and temperature are sensitive to biasing effects, and measurements of these quantities can provide insight into important plasma dynamics and overall effectiveness of the biasing system. To this end, a charge-exchange recombination spectroscopy (ChERS) diagnostic was developed and deployed to measure local impurity ion temperature and velocity in the confinement vessel of C-2W. The system utilizes a new diagnostic neutral beam (40 keV, 8.5 A) and a fiber-coupled spectrometer with an image-intensified high-speed camera to measure beam-induced spectral line emission at multiple lines-of-sight. Design details and the first experimental results obtained with this new diagnostic are presented and discussed.
在TAE技术公司的C - 2W实验中，电极偏置被用于对嵌入磁镜中的场反转配置（FRC）等离子体进行边界控制。理解与FRC旋转、稳定和加热相关的基础物理对于提高机器性能至关重要。杂质离子的旋转和温度对偏置效应敏感，对这些量的测量可以深入了解重要的等离子体动力学以及偏置系统的整体有效性。为此，开发并部署了一种电荷交换复合光谱（ChERS）诊断技术，以测量C - 2W约束容器内局部杂质离子的温度和速度。该系统利用一个新的诊断中性束（40 keV，8.5 A）和一个配备图像增强高速相机的光纤耦合光谱仪，来测量多视线方向上束流诱导的光谱线发射。本文介绍并讨论了该新诊断技术的设计细节和首次实验结果。
