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氧化石墨烯辅助下硅在氢氟酸 - 硝酸溶液中的化学蚀刻及其催化机制

Chemical Etching of Silicon Assisted by Graphene Oxide in an HF-HNO Solution and Its Catalytic Mechanism.

作者信息

Kubota Wataru, Utsunomiya Toru, Ichii Takashi, Sugimura Hiroyuki

机构信息

Department of Materials Science and Engineering, Graduate School of Engineering, Kyoto University, Kyoto 606-8501, Japan.

出版信息

Langmuir. 2021 Aug 5. doi: 10.1021/acs.langmuir.1c01681.

Abstract

Chemical etching of silicon assisted by various types of carbon materials is drawing much attention for the fabrication of silicon micro/nanostructures. We developed a method of chemical etching of silicon that utilizes graphene oxide (GO) sheets to promote the etching reaction in a hydrofluoric acid-nitric acid (HF-HNO) etchant. By using an optimized composition of the HF-HNO etchant, the etching rate under the GO sheets was 100 times faster than that of our HF-HO system used in a previous report. Kinetic analyses showed that the activation energy of the etching reaction was almost the same at both the bare silicon and GO-covered areas. We propose that adsorption sites for the reactant in the GO sheets enhance the reaction frequency, leading to a deeper etching in the GO areas than the bare areas. Furthermore, GO sheets with more defects were found to have higher catalytic activities. This suggests that defects in the GO sheets function as adsorption sites for the reactant, thereby enhancing the etching rate under the sheets.

摘要

在硅微/纳米结构制造中,各类碳材料辅助的硅化学蚀刻备受关注。我们开发了一种硅化学蚀刻方法,该方法利用氧化石墨烯(GO)片层在氢氟酸 - 硝酸(HF - HNO)蚀刻剂中促进蚀刻反应。通过使用优化组成的HF - HNO蚀刻剂,GO片层下的蚀刻速率比我们先前报告中使用的HF - HO系统快100倍。动力学分析表明,裸硅区域和GO覆盖区域的蚀刻反应活化能几乎相同。我们提出,GO片层中反应物的吸附位点提高了反应频率,导致GO区域比裸区域蚀刻更深。此外,发现具有更多缺陷的GO片层具有更高的催化活性。这表明GO片层中的缺陷作为反应物的吸附位点,从而提高了片层下的蚀刻速率。

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