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经皮左心耳封堵术后的住院时间:前瞻性、多中心 Amplatzer Amulet 封堵器观察研究的数据。

Length of stay following percutaneous left atrial appendage occlusion: Data from the prospective, multicenter Amplatzer Amulet Occluder Observational Study.

机构信息

Medical Faculty, Division of Cardiology, Pulmonology and Vascular Medicine, Heinrich-Heine-University Düsseldorf, Düsseldorf, Germany.

Department of Cardiology, Aarhus University Hospital, Aarhus, Denmark.

出版信息

PLoS One. 2021 Aug 10;16(8):e0255721. doi: 10.1371/journal.pone.0255721. eCollection 2021.

Abstract

AIMS

To evaluate factors influencing the length of stay in patients undergoing percutaneous left atrial appendage occlusion (LAAO).

METHODS AND RESULTS

Patient characteristics, procedural data and the occurrence of serious adverse events were analyzed from the AmplatzerTM AmuletTM Occluder Observational Study. Patients were divided into three groups: same day (S, 0day, n = 60, 5.6%) early (E, 1day, n = 526, 48.9%), regular (R, 2-3days, n = 338, 31.4%) and late (L, ≥4days, n = 152, 14.1%) discharge and followed up for 60 days. Procedure and device related SAE during the in-hospital stay (S: 0.0% vs. E: 1.0% vs. R: 2.1% vs. L: 23%, p<0.0001) were a major trigger for a prolonged in-hospital stay. Of the 37 subjects in the late discharge group with an SAE prior to discharge, cardiac or bleeding complications were the most common underlying conditions, occurring in 26 subjects. Multinomial logistic analysis only identified HAS-BLED score as an independent influencing factor (p = 0.04) for a late discharge. After 60 days, mortality tended to be greatest in the late discharge group (S: 0.0% vs. E: 1.0% vs. R: 1.2% vs. L: 3.3%, p = 0.1066).

CONCLUSION

Over half of the subjects receiving an Amplatzer Amulet occluder were discharged within 1 day of the implant procedure. Serious adverse events were a major trigger for a late discharge after LAAO. Increased HAS-BLED score was associated with a prolonged in-hospital stay.

摘要

目的

评估影响行经皮左心耳封堵术(LAAO)患者住院时间的因素。

方法和结果

从 AmplatzerTM AmuletTM 封堵器观察性研究中分析患者特征、手术数据和严重不良事件的发生情况。患者分为三组:当天出院(S 组,0 天,n = 60,5.6%)、早期出院(E 组,1 天,n = 526,48.9%)、常规出院(R 组,2-3 天,n = 338,31.4%)和晚期出院(L 组,≥4 天,n = 152,14.1%),并随访 60 天。住院期间与手术和器械相关的 SAE(S 组:0.0% vs. E 组:1.0% vs. R 组:2.1% vs. L 组:23%,p<0.0001)是延长住院时间的主要诱因。在晚期出院组中,37 例出院前发生 SAE 的患者中,心脏或出血并发症是最常见的潜在原因,发生在 26 例患者中。多变量逻辑分析仅发现 HAS-BLED 评分是晚期出院的独立影响因素(p = 0.04)。60 天后,晚期出院组的死亡率最高(S 组:0.0% vs. E 组:1.0% vs. R 组:1.2% vs. L 组:3.3%,p = 0.1066)。

结论

接受 Amplatzer Amulet 封堵器的患者中,超过一半在植入手术后 1 天内出院。严重不良事件是 LAAO 后晚期出院的主要诱因。HAS-BLED 评分升高与住院时间延长相关。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/4bf3/8354446/2910d8625b9f/pone.0255721.g001.jpg

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