Dolleman Robin J, Chakraborty Debadi, Ladiges Daniel R, van der Zant Herre S J, Sader John E, Steeneken Peter G
Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628CJ Delft, The Netherlands.
ARC Centre of Excellence in Exciton Science, School of Mathematics and Statistics, The University of Melbourne, Melbourne, Victoria 3010, Australia.
Nano Lett. 2021 Sep 22;21(18):7617-7624. doi: 10.1021/acs.nanolett.1c02237. Epub 2021 Aug 30.
The resonance frequency of membranes depends on the gas pressure due to the squeeze-film effect, induced by the compression of a thin gas film that is trapped underneath the resonator by the high-frequency motion. This effect is particularly large in low-mass graphene membranes, which makes them promising candidates for pressure-sensing applications. Here, we study the squeeze-film effect in single-layer graphene resonators and find that their resonance frequency is lower than expected from models assuming ideal compression. To understand this deviation, we perform Boltzmann and continuum finite-element simulations and propose an improved model that includes the effects of gas leakage and can account for the observed pressure dependence of the resonance frequency. Thus, this work provides further understanding of the squeeze-film effect and provides further directions into optimizing the design of squeeze-film pressure sensors from 2D materials.
由于挤压薄膜效应,薄膜的共振频率取决于气体压力,这种效应是由高频运动将薄气膜困在谐振器下方并对其进行压缩而产生的。这种效应在低质量的石墨烯薄膜中尤为显著,这使得它们成为压力传感应用的理想候选材料。在这里,我们研究了单层石墨烯谐振器中的挤压薄膜效应,发现它们的共振频率低于假设理想压缩的模型所预期的值。为了理解这种偏差,我们进行了玻尔兹曼和连续介质有限元模拟,并提出了一个改进模型,该模型包括气体泄漏的影响,能够解释观察到的共振频率对压力的依赖性。因此,这项工作进一步加深了我们对挤压薄膜效应的理解,并为优化二维材料挤压薄膜压力传感器的设计提供了进一步的方向。