Soleimanzadeh Reza, Naamoun Mehdi, Floriduz Alessandro, Khadar Riyaz Abdul, van Erp Remco, Matioli Elison
Ecole Polytechnique Federale de Lausanne (EPFL), Lausanne, Switzerland.
ACS Appl Mater Interfaces. 2021 Sep 15;13(36):43516-43523. doi: 10.1021/acsami.1c08761. Epub 2021 Aug 31.
The integration of diamond and GaN has been highly pursued for thermal management purposes as well as combining their exceptional complementary properties for power electronics applications and novel semiconductor heterostructures. However, the growth of diamond-on-GaN is challenging due to the high lattice and thermal expansion mismatches. The weak adhesion of diamond to GaN and high residual stresses after the deposition often result in the diamond film delamination or development of cracks, which hinder the subsequent device fabrication. Here, we present a new seed dibbling method for seeding and growing high-quality diamond films on foreign substrates, in particular on cost-effective GaN-on-Si, with significantly improved adhesion. Diamond films grown conformally on patterned GaN-on-Si presented high quality with significantly larger grains and a 95% sp/sp ratio, excellent interface between diamond and GaN, and lower residual stresses (as low as 0.2 GPa) compared to conventional methods. In addition, the method provided excellent adhesion, enabling a reliable polishing of the as-grown diamond films on GaN on Si without any delamination, resulting in smooth diamond-on-GaN substrates with subnanometer root-mean-square roughness. Diamond layers deposited via seed dibbling resulted in a 2-fold improvement in the effective thermal conductivity for GaN-on-Si with only a 20 μm thick diamond layer. This method opens many new possibilities for the development of high-performance power electronic devices and integrated devices with excellent thermal management based on a diamond-on-GaN platform. In addition, this technique could be extended to other substrates to combine the outstanding properties of diamond with other kinds of devices.
为了实现热管理,以及将它们卓越的互补特性结合用于电力电子应用和新型半导体异质结构,金刚石与氮化镓的集成一直备受关注。然而,由于晶格和热膨胀失配较大,在氮化镓上生长金刚石具有挑战性。金刚石与氮化镓之间的附着力较弱,沉积后残余应力较高,这常常导致金刚石薄膜分层或出现裂纹,从而阻碍后续器件制造。在此,我们提出一种新的籽晶点涂法,用于在异质衬底上,特别是在具有成本效益的硅基氮化镓上,播种并生长高质量的金刚石薄膜,显著提高附着力。在图案化的硅基氮化镓上共形生长的金刚石薄膜呈现出高质量,晶粒明显更大,sp/sp比达到95%,金刚石与氮化镓之间的界面优异,与传统方法相比残余应力更低(低至0.2吉帕)。此外,该方法提供了优异的附着力,能够对生长在硅基氮化镓上的金刚石薄膜进行可靠的抛光而不会分层,从而得到均方根粗糙度低于亚纳米的光滑的氮化镓上金刚石衬底。通过籽晶点涂沉积的金刚石层使硅基氮化镓的有效热导率提高了两倍,而金刚石层厚度仅为20微米。这种方法为基于氮化镓上金刚石平台开发高性能电力电子器件和具有优异热管理的集成器件开辟了许多新的可能性。此外,该技术可以扩展到其他衬底,以将金刚石的优异特性与其他类型的器件相结合。