Fu Yao, Chen Zhenhua, Tang Zhilie, Ji Yanhong
Appl Opt. 2021 Sep 20;60(27):8472-8479. doi: 10.1364/AO.435283.
Due to the sensitivity of wave plates to the angle of incidence (AOI) of light, the accuracy of a dual rotating retarder Mueller matrix polarimeter is also influenced by the AOI. Unlike other conventional systematic errors, the phase retardance error of wave plates caused by AOI is a periodic perturbation rather than a constant. We propose a new method to eliminate the influence of AOI based on a numerical calibration method. To verify the reliability of the proposed calibration method, we measured various types of samples in a transmission Mueller matrix measuring system, such as air, dichroic samples, and birefringent samples, with different AOI conditions. It is demonstrated that the new calibration method can effectively eliminate the influence of AOI. After calibration, the maximum measurement error can be reduced to less than 0.02.
由于波片对光的入射角（AOI）敏感，双旋转延迟器穆勒矩阵偏振计的精度也会受到AOI的影响。与其他传统系统误差不同，由AOI引起的波片相位延迟误差是周期性扰动而非恒定误差。我们提出了一种基于数值校准方法来消除AOI影响的新方法。为了验证所提出校准方法的可靠性，我们在透射穆勒矩阵测量系统中，在不同AOI条件下测量了各种类型的样品，如空气、二向色性样品和双折射样品。结果表明，新的校准方法可以有效消除AOI的影响。校准后，最大测量误差可降至小于0.02。
