Shen Yitian, Zhang Yongsheng, Li Wei, Miao Hong, Wang Yongzhe, Zeng Yi
The State Key Lab of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai, China.
Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing, China.
J Microsc. 2021 Dec;284(3):256-265. doi: 10.1111/jmi.13061. Epub 2021 Nov 1.
Partially missing bands in the preset region for Hough transform might strongly affect the accuracy of indexing Kikuchi patterns and reduce the quality of electron backscatter diffraction (EBSD) maps. This paper proposes a novel local band detection method for such kind of low-quality patterns. The approach involves rotating bands to vertical direction, detecting the local line segments through calculating the largest horizontal average grey gradient with a constant interval of 400 pixels in vertical direction, and applying Hough transform as well as weighted averaging to these line clusters to unify the edges of Kikuchi band. Therefore, even if only part of a Kikuchi band is visible, the entire band can also be accurately extracted. The average interplanar angle error obtained by the proposed method is approximately 29.0% less than those obtained by Hough transform-based technique. Moreover, the comparison of mean angular deviation (MAD) is also discussed. The average MAD of this method is about 38.5% lower than that of Hough transform-based technique. Consequently, the local Kikuchi band detection method is expected to be used for post-processing and re-indexing the EBSD low-quality patterns.
在用于霍夫变换的预设区域中部分缺失的带可能会严重影响菊池线花样标定的准确性，并降低电子背散射衍射（EBSD）图谱的质量。本文针对此类低质量花样提出了一种新颖的局部带检测方法。该方法包括将带旋转至垂直方向，通过在垂直方向上以400像素的恒定间隔计算最大水平平均灰度梯度来检测局部线段，并对这些线段簇应用霍夫变换以及加权平均来统一菊池带的边缘。因此，即使菊池带只有一部分可见，也能准确提取出整个带。所提方法获得的平均晶面间角度误差比基于霍夫变换的技术所获得的误差大约小29.0%。此外，还讨论了平均角偏差（MAD）的比较。该方法的平均MAD比基于霍夫变换的技术低约38.5%。因此，局部菊池带检测方法有望用于EBSD低质量花样的后处理和重新标定。
