Department of Applied Physics, The Center for Nanoscience and Nanotechnology, The Hebrew University, Jerusalem 91904, Israel.
ACS Nano. 2021 Nov 23;15(11):17375-17383. doi: 10.1021/acsnano.1c06646. Epub 2021 Oct 11.
Volumetric imaging with high spatiotemporal resolution is of utmost importance for various applications ranging from aerospace and defense to real-time imaging of dynamic biological processes. To facilitate three-dimensional sectioning, current technology relies on mechanisms to reject light from adjacent out-of-focus planes either spatially or by other means. Yet, the combination of rapid acquisition time and high axial resolution is still elusive, motivating a persistent pursuit for emerging imaging approaches. Here we introduce and experimentally demonstrate a concept named spectrally gated microscopy (SGM), which enables a single-shot interrogation over the full axial dimension while maintaining a submicron sectioning resolution. SGM utilizes two important features enabled by flat optics (., metalenses or diffractive lenses), namely, a short focal length and strong chromatic aberrations. Using SGM we demonstrate three-dimensional imaging of millimeter-scale samples while scanning only the lateral dimension, presenting a significant advantage over state-of-the-art technology.
高时空分辨率的容积成像是从航空航天到动态生物过程的实时成像等各种应用中至关重要的。为了促进三维切片，当前技术依赖于通过空间或其他方式来拒绝来自相邻离焦平面的光的机制。然而，快速采集时间和高轴向分辨率的结合仍然难以实现，这促使人们不断寻求新兴的成像方法。在这里，我们介绍并实验证明了一种名为光谱门控显微镜（SGM）的概念，它能够在保持亚微米切片分辨率的同时，在整个轴向尺寸上进行单次询问。SGM 利用了平面光学（例如，金属镜或衍射透镜）所具有的两个重要特性，即短焦距和强色差。使用 SGM，我们演示了毫米级样本的三维成像，而仅扫描横向尺寸，这与最先进的技术相比具有显著优势。
