Yun Dongwon, Kim Jong-Bong
Department of Robotics Engineering, Daegu Gyeongbuk Institute of Science and Technology, 333 Techno jungang-daero Hyeonpung, Dalseong-gun, Daegu 42988, Korea.
Department of Mechanical and Automotive Engineering, Seoul National University of Science and Technology, 232 Gongneung-ro, Nowon-Gu, Seoul 01811, Korea.
Polymers (Basel). 2021 Oct 2;13(19):3398. doi: 10.3390/polym13193398.
This study provides an analysis of the hot embossing process with poly methyl methacrylate (PMMA) film. The hot embossing process engraves a fine pattern on a flexible film using a stamp, applied heat and pressure. As the quality of the embossing pattern varies according to various process variables, the mechanism of making the embossed shape is complicated and difficult to analyze. Therefore, analysis takes much time and cost because it usually has to perform a lot of experiments to find an appropriate process condition. In this paper, the hot embossing process was analyzed using a computational analysis method to quickly find the optimal process. To do this, we analyzed the embossing phenomenon using the finite element method (FEM) and arbitrary Lagrangian-Eulerian (ALE) re-mesh technique. For this purpose, we developed a constitutive model considering the strain, strain rate, temperature-dependent stress and softening of the flexible film. Work hardening, strain softening, and temperature-softening behavior of PMMA materials were well described by the proposed method. The developed constitutive model were applied in the embossing analysis via user-subroutine. This proposed method allowed a precise analysis of the phenomenon of film change during the hot embossing process.
本研究对使用聚甲基丙烯酸甲酯(PMMA)薄膜的热压花工艺进行了分析。热压花工艺是通过使用模具、施加热量和压力在柔性薄膜上雕刻精细图案。由于压花图案的质量会因各种工艺变量而有所不同,因此制作压花形状的机制复杂且难以分析。所以,分析需要花费大量时间和成本,因为通常必须进行大量实验才能找到合适的工艺条件。在本文中,采用计算分析方法对热压花工艺进行分析,以快速找到最佳工艺。为此,我们使用有限元方法(FEM)和任意拉格朗日 - 欧拉(ALE)重新网格化技术对压花现象进行了分析。为此,我们开发了一个考虑柔性薄膜应变、应变率、温度相关应力和软化的本构模型。所提出的方法很好地描述了PMMA材料的加工硬化、应变软化和温度软化行为。通过用户子程序将开发的本构模型应用于压花分析。该方法能够对热压花过程中薄膜变化现象进行精确分析。