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随机薄膜去湿的格子玻尔兹曼模拟

Lattice Boltzmann simulations of stochastic thin film dewetting.

作者信息

Zitz S, Scagliarini A, Harting J

机构信息

Helmholtz Institute Erlangen-Nürnberg for Renewable Energy, Forschungszentrum Jülich, Fürther Strasse 248, 90429 Nürnberg, Germany.

Department of Chemical and Biological Engineering, Friedrich-Alexander-Universität Erlangen-Nürnberg, Fürther Straße 248, 90429 Nürnberg, Germany.

出版信息

Phys Rev E. 2021 Sep;104(3-1):034801. doi: 10.1103/PhysRevE.104.034801.

Abstract

We study numerically the effect of thermal fluctuations and of variable fluid-substrate interactions on the spontaneous dewetting of thin liquid films. To this aim, we use a recently developed lattice Boltzmann method for thin liquid film flows, equipped with a properly devised stochastic term. While it is known that thermal fluctuations yield shorter rupture times, we show that this is a general feature of hydrophilic substrates, irrespective of the contact angle θ. The ratio between deterministic and stochastic rupture times, though, decreases with θ. Finally, we discuss the case of fluctuating thin film dewetting on chemically patterned substrates and its dependence on the form of the wettability gradients.

摘要

我们通过数值方法研究了热涨落和可变流体 - 基底相互作用对薄液膜自发去湿的影响。为此,我们使用了一种最近开发的用于薄液膜流动的格子玻尔兹曼方法,并配备了精心设计的随机项。虽然已知热涨落会导致破裂时间缩短,但我们表明,这是亲水性基底的一个普遍特征,与接触角θ无关。不过,确定性破裂时间与随机破裂时间之比会随着θ减小。最后,我们讨论了化学图案化基底上波动薄液膜去湿的情况及其对润湿性梯度形式的依赖性。

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