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从太赫兹条纹电离电子能谱中的能量中心偏移推导X射线脉冲持续时间。

Deriving x-ray pulse duration from center-of-energy shifts in THz-streaked ionized electron spectra.

作者信息

Wieland Marek, Kabachnik Nikolay M, Drescher Markus, Deng Yunpei, Arbelo Yunieski, Stojanovic Nikola, Steffen Bernd, Roensch-Schulenburg Juliane, Ischebeck Rasmus, Malyzhenkov Alexander, Prat Eduard, Juranić Pavle

出版信息

Opt Express. 2021 Oct 11;29(21):32739-32754. doi: 10.1364/OE.432761.

Abstract

A fast and robust, yet simple, method has been developed for the immediate characterization of x-ray pulse durations via IR/THz streaking that uses the center of energy (COE) of the photoelectron spectrum for the evaluation. The manuscript presents theory and numerical models demonstrating that the maximum COEs shift as a function of the pulse duration and compares them to existing data for validation. It further establishes that the maximum COE can be derived from two COE measurements set at a phase of π/2 apart. The theory, model, and data agree with each other very well, and they present a way to measure pulse durations ranging from sub-fs to tens of fs on-the-fly with a fairly simple experimental setup.

摘要

已经开发出一种快速、稳健且简单的方法,用于通过红外/太赫兹条纹成像即时表征X射线脉冲持续时间,该方法利用光电子能谱的能量中心(COE)进行评估。该手稿介绍了理论和数值模型,证明了最大COE随脉冲持续时间的变化,并将其与现有数据进行比较以进行验证。它进一步确定,最大COE可以从相隔π/2相位设置的两次COE测量中得出。理论、模型和数据彼此非常吻合,它们提供了一种通过相当简单的实验装置即时测量从亚飞秒到几十飞秒脉冲持续时间的方法。

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