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基于折射率和太赫兹条纹到达时间工具在硬X射线自由电子激光中的相关性

Correlation of refractive index based and THz streaking arrival time tools for a hard X-ray free-electron laser.

作者信息

Błachucki Wojciech, Johnson Philip J M, Usov Ivan, Divall Edwin, Cirelli Claudio, Knopp Gregor, Juranić Pavle, Patthey Luc, Szlachetko Jakub, Lemke Henrik, Milne Christopher, Arrell Christopher

机构信息

Institute of Nuclear Physics, Polish Academy of Sciences, 31-342 Kraków, Poland.

SwissFEL, Paul Scherrer Institute, 5232 Villigen, Switzerland.

出版信息

J Synchrotron Radiat. 2024 Mar 1;31(Pt 2):233-242. doi: 10.1107/S1600577523010500. Epub 2024 Jan 22.

DOI:10.1107/S1600577523010500
PMID:38252522
原文链接:https://pmc.ncbi.nlm.nih.gov/articles/PMC10914176/
Abstract

To fully exploit ultra-short X-ray pulse durations routinely available at X-ray free-electron lasers to follow out-of-equilibrium dynamics, inherent arrival time fluctuations of the X-ray pulse with an external perturbing laser pulse need to be measured. In this work, two methods of arrival time measurement were compared to measure the arrival time jitter of hard X-ray pulses. The methods were photoelectron streaking by a THz field and a transient refractive index change of a semiconductor. The methods were validated by shot-to-shot correction of a pump-probe transient reflectivity measurement. An ultimate shot-to-shot full width at half-maximum error between the devices of 19.2 ± 0.1 fs was measured.

摘要

为了充分利用X射线自由电子激光常规提供的超短X射线脉冲持续时间来追踪非平衡动力学，需要测量X射线脉冲与外部扰动激光脉冲之间固有的到达时间波动。在这项工作中，比较了两种到达时间测量方法来测量硬X射线脉冲的到达时间抖动。这两种方法分别是太赫兹场光电子条纹法和半导体的瞬态折射率变化法。通过泵浦-探测瞬态反射率测量的逐次校正对这些方法进行了验证。测量了两种装置之间最终的逐次半高全宽误差为19.2±0.1 fs。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/06482fc7395b/s-31-00233-fig7.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/3f0934a88163/s-31-00233-fig1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/e048d5f97c55/s-31-00233-fig2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/8f821a416f6f/s-31-00233-fig3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/856b943870b8/s-31-00233-fig4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/5a249b000ff4/s-31-00233-fig5.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/f175779941ba/s-31-00233-fig6.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/06482fc7395b/s-31-00233-fig7.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/3f0934a88163/s-31-00233-fig1.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/e048d5f97c55/s-31-00233-fig2.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/8f821a416f6f/s-31-00233-fig3.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/856b943870b8/s-31-00233-fig4.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/5a249b000ff4/s-31-00233-fig5.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/f175779941ba/s-31-00233-fig6.jpg
https://cdn.ncbi.nlm.nih.gov/pmc/blobs/29ba/10914176/06482fc7395b/s-31-00233-fig7.jpg

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本文引用的文献

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Experimental station Bernina at SwissFEL: condensed matter physics on femtosecond time scales investigated by X-ray diffraction and spectroscopic methods.
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SwissFEL Aramis beamline photon diagnostics.瑞士自由电子激光阿瑞马斯光束线光子诊断仪
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