Kim Jisoo, Kagias Matias, Marone Federica, Shi Zhitian, Stampanoni Marco
Institute for Biomedical Engineering, University and ETH Zürich, 8092, Zurich, Switzerland.
Swiss Light Source, Paul Scherrer Institut, 5232, Villigen, Switzerland.
Sci Rep. 2021 Nov 29;11(1):23046. doi: 10.1038/s41598-021-02467-w.
Microstructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols based on scanning small-angle X-ray scattering and X-ray grating interferometry inherently require long scan times even with highly brilliant X-ray sources. Recent developments in X-ray diffractive optics towards circular pattern arrays enable fast single-shot acquisition of the sample scattering properties with 2D omnidirectional sensitivity. X-ray scattering tensor tomography with the use of this circular grating array has been demonstrated. We propose here simple yet inherently rapid acquisition protocols for X-ray scattering tensor tomography leveraging on these new optical elements. Results from both simulation and experimental data, supported by a null space analysis, suggest that the proposed acquisition protocols are not only rapid but also corroborate that sufficient information for the accurate volumetric reconstruction of the scattering properties is provided. The proposed acquisition protocols will build the basis for rapid inspection and/or time-resolved tensor tomography of the microstructural organisation over an extended field of view.
了解整个样本的微观结构信息对于理解材料的宏观行为很重要。X射线散射张量断层扫描有助于研究统计上大样本体积中的微观结构组织。然而，基于扫描小角X射线散射和X射线光栅干涉测量的既定采集协议，即使使用高亮度X射线源，本质上也需要很长的扫描时间。X射线衍射光学向圆形图案阵列的最新发展使得能够以二维全向灵敏度快速单次采集样本散射特性。利用这种圆形光栅阵列的X射线散射张量断层扫描已经得到了证明。我们在此提出简单但本质上快速的X射线散射张量断层扫描采集协议，利用这些新的光学元件。由零空间分析支持的模拟和实验数据结果表明，所提出的采集协议不仅快速，而且证实提供了用于准确体积重建散射特性的足够信息。所提出的采集协议将为在扩展视野内对微观结构组织进行快速检查和/或时间分辨张量断层扫描奠定基础。
