Dreier Erik S, Silvestre Chantal, Kehres Jan, Turecek Daniel, Khalil Mohamad, Hemmingsen Jens H, Hansen Ole, Jakubek Jan, Feidenhans'l Robert, Olsen Ulrik L
Opt Lett. 2020 Feb 15;45(4):1021-1024. doi: 10.1364/OL.381420.
Omni-directional, ultra-small-angle x-ray scattering imaging provides a method to measure the orientation of micro-structures without having to resolve them. In this letter, we use single-photon localization with the Timepix3 chip to demonstrate, to the best of our knowledge, the first laboratory-based implementation of single-shot, omni-directional x-ray scattering imaging using the beam-tracking technique. The setup allows a fast and accurate retrieval of the scattering signal using a simple absorption mask. We suggest that our new approach may enable faster laboratory-based tensor tomography and could be used for energy-resolved x-ray scattering imaging.
全向、超小角X射线散射成像提供了一种无需分辨微观结构就能测量其取向的方法。在本信函中，据我们所知，我们使用Timepix3芯片进行单光子定位，以展示基于实验室的首次利用光束跟踪技术实现的单次全向X射线散射成像。该装置使用简单的吸收掩膜就能快速、准确地获取散射信号。我们认为，我们的新方法可能使基于实验室的张量断层扫描更快实现，并且可用于能量分辨X射线散射成像。
