Park Jung Sik, Kang Yoon-Jung, Choi Sun Eui, Jo Yong Nam
Product Application Support, JEOL Korea, Seoul, 05355, South Korea.
Industry University Cooperation Foundation, Hanyang University, Seoul, 04763, South Korea.
Appl Microsc. 2021 Dec 23;51(1):19. doi: 10.1186/s42649-021-00068-5.
The main purpose of this paper is the preparation of transmission electron microscopy (TEM) samples from the microsized powders of lithium-ion secondary batteries. To avoid artefacts during TEM sample preparation, the use of ion slicer milling for thinning and maintaining the intrinsic structure is described. Argon-ion milling techniques have been widely examined to make optimal specimens, thereby making TEM analysis more reliable. In the past few years, the correction of spherical aberration (Cs) in scanning transmission electron microscopy (STEM) has been developing rapidly, which results in direct observation at an atomic level resolution not only at a high acceleration voltage but also at a deaccelerated voltage. In particular, low-kV application has markedly increased, which requires a sufficiently transparent specimen without structural distortion during the sample preparation process. In this study, sample preparation for high-resolution STEM observation is accomplished, and investigations on the crystal integrity are carried out by Cs-corrected STEM.
本文的主要目的是从锂离子二次电池的微米级粉末制备透射电子显微镜（TEM）样品。为避免TEM样品制备过程中出现假象，本文介绍了使用离子切片机研磨来减薄并保持其固有结构。为制备出最佳样品，人们已对氩离子研磨技术进行了广泛研究，从而使TEM分析更加可靠。在过去几年中，扫描透射电子显微镜（STEM）中的球差（Cs）校正技术发展迅速，这使得不仅能在高加速电压下，而且能在减速电压下以原子级分辨率进行直接观察。特别是低千伏应用显著增加，这就要求在样品制备过程中要有一个足够透明且无结构畸变的样品。在本研究中，完成了用于高分辨率STEM观察的样品制备，并通过Cs校正STEM对晶体完整性进行了研究。
