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用于储氢的CoPd合金中钯稀释极限的电阻率测试

Resistivity Testing of Palladium Dilution Limits in CoPd Alloys for Hydrogen Storage.

作者信息

Das Sudhansu Sekhar, Kopnov Gregory, Gerber Alexander

机构信息

School of Physics and Astronomy, Tel Aviv University, Ramat Aviv, Tel Aviv 69978, Israel.

School of Physical Science, National Institute of Science Education and Research Bhubaneswar, Jatni 752050, India.

出版信息

Materials (Basel). 2021 Dec 24;15(1):111. doi: 10.3390/ma15010111.

Abstract

Palladium satisfies most of the requirements for an effective hydrogen storage material with two major drawbacks: it has a relatively low gravimetric hydrogen density and is prohibitively expensive for large scale applications. Pd-based alloys should be considered as possible alternatives to a pure Pd. The question is how much one can dilute the Pd concentration in a variety of candidate materials while preserving the hydrogen absorption capability. We demonstrate that the resistivity measurements of thin film alloy samples can be used for a qualitative high-throughput screening and study of the hydrogen absorbing properties over the entire range of palladium concentrations. Contrary to palladium-rich alloys where additional hydrogen scattering indicates a degree of hydrogen content, the diluted alloy films respond by a decrease in resistance due to their thickness expansion. Evidence of significant hydrogen absorption was found in thin CoPd films diluted to just 20% of Pd.

摘要

钯满足了有效储氢材料的大部分要求,但存在两个主要缺点:其重量氢密度相对较低,且对于大规模应用来说成本高得令人望而却步。钯基合金应被视为纯钯的可能替代品。问题在于,在各种候选材料中,能在多大程度上稀释钯的浓度同时又保留吸氢能力。我们证明,薄膜合金样品的电阻率测量可用于定性高通量筛选,并研究整个钯浓度范围内的吸氢特性。与富钯合金不同,在富钯合金中额外的氢散射表明了一定程度的氢含量,而稀释后的合金薄膜由于厚度膨胀,电阻会降低。在稀释至仅含20%钯的钴钯薄膜中发现了显著吸氢的证据。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/f789/8746098/83244342c658/materials-15-00111-g001.jpg

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