Morales-Lovera Hector-Noel, Olvera-Cervantes Jose-Luis, Perez-Ramos Aldo-Eleazar, Corona-Chavez Alonso, Saavedra Carlos E
Instituto Nacional de Astrofísica, Óptica y Electrónica, Puebla, Mexico.
CONACYT-CICESE, Unidad Monterrey, Apodaca, Mexico.
Sci Rep. 2022 Feb 9;12(1):2205. doi: 10.1038/s41598-022-06259-8.
In this work, a sensor in microstrip technology and a methodology for measuring the real part and the imaginary part of the complex uniaxial permittivity of solid anisotropic samples are presented. The sensor is based on a pair of parallel lines coupled resonators and a cleft arranged in the coupling region which allows to hold the samples under test (SUTs). The proposed methodology relates the change in the even/odd resonance frequency with the real part of the permittivity in the vertical/horizontal direction, and the change in the Q factor of the even/odd mode with the imaginary part of the permittivity in the vertical/horizontal direction. The methodology was successfully verified with the characterization, at 2.43 GHz of anisotropic samples of printed PLA, Diclad 880, and RO4350B using the knowns materials: RT5870, PTFE and RO4003.
在这项工作中,提出了一种采用微带技术的传感器以及一种用于测量固体各向异性样品复单轴介电常数实部和虚部的方法。该传感器基于一对平行耦合线谐振器以及位于耦合区域的一个用于放置被测样品(SUT)的槽口。所提出的方法将偶/奇谐振频率的变化与垂直/水平方向介电常数的实部相关联,将偶/奇模品质因数的变化与垂直/水平方向介电常数的虚部相关联。使用已知材料RT5870、聚四氟乙烯和RO4003,在2.43 GHz频率下对印刷聚乳酸(PLA)、Diclad 880和RO4350B的各向异性样品进行表征,成功验证了该方法。