Joint enhancement and denoising in electronic speckle pattern interferometry fringe patterns with low contrast or uneven illumination via an oriented variational Retinex model.

Simultaneous speckle reduction and contrast enhancement for electronic speckle pattern interferometry (ESPI) fringe patterns is a challenging task. In this paper, we propose a joint enhancement and denoising method based on the oriented variational Retinex model for ESPI fringe patterns with low contrast or uneven illumination. In our model, we use the structure prior to constrain the illumination and introduce a fractional-order differential to constrain the reflectance for enhancement, then use the second-order partial derivative of the reflectance as the denoising term to reduce noise. The proposed model is solved using the sequential method to obtain piecewise smoothed illumination and noise-suppressed reflectance sequentially, which avoids remaining noise in the illumination and reflectance map. After obtaining the refined illuminance and reflectance, we substitute the gamma-corrected illuminance into the camera response function to further adjust the reflectance as the final enhancement result. We test our proposed method on two non-uniform illumination computer-simulated and two low-contrast experimentally obtained ESPI fringe patterns. Finally, we compare our method with three other joint enhancement and denoising variational Retinex methods.