Tuleushev Adil Z, Harrison Fiona E, Kozlovskiy Artem L, Zdorovets Maxim V
Flerov Laboratory of Nuclear Reactions, Joint Institute for Nuclear Research, 141980 Dubna, Russia.
Engineering Profile Laboratory, L.N. Gumilyov Eurasian National University, Nur-Sultan 010008, Kazakhstan.
Polymers (Basel). 2022 Feb 25;14(5):923. doi: 10.3390/polym14050923.
This paper presents a new analysis of the experimental transmission spectra of polyethylene terephthalate (PET) films before and after irradiation with swift heavy ions (SHI) films, as reported previously by the authors. It is shown that the absorption edge red shift for irradiated films contains two regions of exponential form, one of which is located in the UV region and the other at lower energy, mainly in the visible part of the spectrum. The behaviour of the transmission curves under different irradiating fluences demonstrates that these two regions reflect respectively the electron-enriched core of the latent track and its electron-depleted peripheral halo. The focal point method yields a bandgap energy of 4.1 eV for the electron-enriched core of the latent track, which is similar to -doped semiconductors, and a bandgap of about 1.3-1.5 eV for the electron-depleted halo, similar to -doped semiconductors. The boundary between the latent track cores and halos corresponds to a conventional semiconductor - junction. The values of the characteristic Urbach energy determined from experimental data correspond to the nonradiative transition energy between the excited singlet and triplet levels of benzene-carboxyl complexes in repeat units of the PET chain molecule. A parallel is drawn between the SHI-induced redistribution of electrons held in structural traps in the PET film and chemical redox reactions, which involve the redistribution of electrons in chemical bonds. It is suggested that alkali etching triggers the release of excess electrons in the latent track cores, which act as a catalyst for the fragmentation of PET chain molecules along the latent tracks of the SHI irradiation.
本文对聚对苯二甲酸乙二酯(PET)薄膜在快速重离子(SHI)辐照前后的实验透射光谱进行了新的分析,这是作者之前报道过的。结果表明,辐照薄膜的吸收边红移包含两个指数形式的区域,其中一个位于紫外区域,另一个能量较低,主要在光谱的可见光部分。不同辐照通量下透射曲线的行为表明,这两个区域分别反映了潜径迹的富电子核心及其贫电子外围晕圈。焦点法得出潜径迹富电子核心的带隙能量为4.1 eV,这与n型掺杂半导体相似,贫电子晕圈的带隙约为1.3 - 1.5 eV,与p型掺杂半导体相似。潜径迹核心与晕圈之间的边界对应于传统的半导体p - n结。根据实验数据确定的特征乌尔巴赫能量值对应于PET链分子重复单元中苯 - 羧基配合物激发单重态和三重态之间的非辐射跃迁能量。本文将PET薄膜中结构陷阱中电子的SHI诱导重新分布与涉及化学键中电子重新分布的化学氧化还原反应进行了类比。有人提出,碱蚀刻会触发潜径迹核心中多余电子的释放,这些电子充当了PET链分子沿SHI辐照潜径迹断裂的催化剂。