Sk Shamim, Shahi Nisha, Pandey Sudhir K
School of Basic Sciences, Indian Institute of Technology Mandi, Kamand-175075, India.
School of Materials Science and Technology, Indian Institute of Technology (Banaras Hindu University), Varanasi 221005, India.
J Phys Condens Matter. 2022 Apr 26;34(26). doi: 10.1088/1361-648X/ac655a.
Here, we study the thermoelectric properties of topological semimetal CoSi in the temperature range 300-800 K by using combined experimental and density functional theory (DFT) based methods. CoSi is synthesized using arc melting technique and the Rietveld refinement gives the lattice parameters of=== 4.445 Å. The measured values of Seebeck coefficient () shows the non-monotonic behaviour in the studied temperature range with the value of ∼-81V Kat room temperature. The || first increases till 560 K (∼-93V K) and then decreases up to 800 K (∼-84V K) indicating the dominating n-type behaviour in the full temperature range. The electrical conductivity,(thermal conductivity,) shows the monotonic decreasing (increasing) behaviour with the values of∼5.2×105(12.1 W m K) and∼3.6×105(14.2 W m K) Ω mat 300 K and 800 K, respectively. Theexhibits the temperature dependency as,∝. The DFT based Boltzmann transport theory is used to understand these behaviour. The multi-band electron and hole pockets appear to be mainly responsible for deciding the temperature dependent transport behaviour. Specifically, the decrease in the || above 560 K and change in the slope ofaround 450 K are due to the contribution of thermally generated charge carriers from the hole pockets. The temperature dependent relaxation time () is computed by comparing the experimentalwith calculated/and it shows temperature dependency of 1/. Further this value ofis used to calculate the temperature dependent electronic part of thermal conductivity () and it gives a fairly good match with the experiment. Present study suggests that electronic band-structure obtained from DFT provides a reasonably good estimate of the transport coefficients of CoSi in the high temperature region of 300-800 K.
在此,我们通过结合实验和基于密度泛函理论(DFT)的方法,研究了拓扑半金属CoSi在300 - 800 K温度范围内的热电性质。CoSi采用电弧熔炼技术合成,通过Rietveld精修得到晶格参数a = 4.445 Å。塞贝克系数(S)的测量值在研究的温度范围内呈现非单调行为,室温下约为 -81 μV K。S || 首先增加到560 K(约 -93 μV K),然后下降到800 K(约 -84 μV K),表明在整个温度范围内主要为n型行为。电导率(σ)、热导率(κ)分别呈现单调递减(递增)行为,在300 K和800 K时的值分别约为5.2×105(12.1 W m -1 K -1)和3.6×105(14.2 W m -1 K -1)Ω -1 m。κ表现出与T成正比的温度依赖性。基于DFT的玻尔兹曼输运理论用于理解这些行为。多带电子和空穴口袋似乎主要决定了温度依赖的输运行为。具体而言,560 K以上S || 的下降以及约450 K时κ斜率的变化是由于空穴口袋中热产生的电荷载流子的贡献。通过将实验σ与计算的σ和κ进行比较,计算了温度依赖的弛豫时间(τ),它显示出1/T的温度依赖性。此外,该τ值用于计算温度依赖的热导率电子部分(κe),并与实验结果相当吻合。本研究表明,从DFT获得的电子能带结构在300 - 800 K的高温区域对CoSi的输运系数提供了合理良好的估计。