Lin Chun-Yen, Cheng Chih-Hsien, Chi Yu-Chieh, Set Sze Yun, Yamashita Shinji, Lin Gong-Ru
Graduate Institute of Photonics and Optoelectronics, The Department of Electrical Engineering, National Taiwan University, Taipei 10617, Taiwan.
Research Center for Advanced Science and Technology, University of Tokyo, Tokyo 153-0041, Japan.
Nanomaterials (Basel). 2022 Apr 3;12(7):1197. doi: 10.3390/nano12071197.
A low-temperature plasma-enhanced chemical vapor deposition grown germanium (Ge) thin-film is employed as a nonlinear saturable absorber (SA). This Ge SA can passively mode-lock the erbium-doped fiber laser (EDFL) for soliton generation at a central wavelength of 1600 nm. The lift-off and transfer of the Ge film synthesized upon the SiO/Si substrate are performed by buffered oxide etching and direct imprinting. The Ge film with a thickness of 200 nm exhibits its Raman peak at 297 cm, which both the nanocrystalline and polycrystalline Ge phases contribute to. In addition, the Ge thin-film is somewhat oxidized but still provides two primary crystal phases at the (111) and (311) orientations with corresponding diffraction ring radii of 0.317 and 0.173 nm, respectively. The nanocrystalline structure at (111) orientation with a corresponding d-spacing of 0.319 nm is also observed. The linear and nonlinear transmittances of the Ge thin-film are measured to show its self-amplitude modulation coefficient of 0.016. This is better than nano-scale charcoal and carbon-black SA particles for initiating the mode-locking at the first stage. After the Ge-based saturable absorber into the L-band EDFL system without using any polarized components, the narrowest pulsewidth and broadest linewidth of the soliton pulse are determined as 654.4 fs and 4.2 nm, respectively, with a corresponding time-bandwidth product of 0.32 under high pumping conditions.
采用低温等离子体增强化学气相沉积生长的锗(Ge)薄膜作为非线性饱和吸收体(SA)。这种锗饱和吸收体可以被动锁模掺铒光纤激光器(EDFL),在中心波长1600 nm处产生孤子。通过缓冲氧化物蚀刻和直接压印实现生长在SiO/Si衬底上的锗薄膜的剥离和转移。厚度为200 nm的锗薄膜在297 cm处出现拉曼峰,这是由纳米晶和多晶锗相共同贡献的。此外,锗薄膜有些被氧化,但仍提供(111)和(311)取向的两个主要晶相,相应的衍射环半径分别为0.317和0.173 nm。还观察到(111)取向的纳米晶结构,其对应的d间距为0.319 nm。测量了锗薄膜的线性和非线性透过率,显示其自振幅调制系数为0.016。这在启动锁模的第一阶段比纳米级木炭和炭黑饱和吸收体颗粒更好。在将基于锗的饱和吸收体引入L波段EDFL系统且不使用任何偏振组件后,在高泵浦条件下,孤子脉冲的最窄脉冲宽度和最宽带宽分别确定为654.4 fs和4.2 nm,相应的时间带宽积为0.32。