Urquhart Stephen G
Department of Chemistry, University of Saskatchewan, Treaty Six Territory, 110 Science Place, Saskatoon, Saskatchewan S7N 5C9, Canada.
ACS Omega. 2022 Mar 29;7(14):11521-11529. doi: 10.1021/acsomega.2c00228. eCollection 2022 Apr 12.
X-ray spectroptychography is an emerging method for the chemical microanalysis of advanced nanomaterials such as catalysts and batteries. This method builds upon established synchrotron X-ray microscopy and spectromicroscopy techniques with added spatial resolution from ptychography, an algorithmic imaging technique. This minireview will introduce the technique of X-ray spectroptychography, where ptychography is performed with variable photon energy, and discuss recent results and prospects for this method.
X射线谱学叠层成像术是一种用于对催化剂和电池等先进纳米材料进行化学微分析的新兴方法。该方法基于已有的同步加速器X射线显微镜和光谱显微镜技术，并通过叠层成像术（一种算法成像技术）增加了空间分辨率。本综述将介绍X射线谱学叠层成像术，即在可变光子能量下进行叠层成像的技术，并讨论该方法的最新成果和前景。
