Pavoni Eleonora, Yivlialin Rossella, Hardly Joseph Christopher, Fabi Gianluca, Mencarelli Davide, Pierantoni Luca, Bussetti Gianlorenzo, Farina Marco
Department of Information Engineering, Università Politecnica delle Marche Ancona Italy
Department of Physics, Politecnico di Milano p.za Leonardo da Vinci 32 I-20133 Milano Italy.
RSC Adv. 2019 Jul 26;9(40):23156-23160. doi: 10.1039/c9ra04667d. eCollection 2019 Jul 23.
Scanning microwave microscopy (SMM) is based on the interaction between a sample and an electromagnetic evanescent field, in the microwave frequency range. SMM is usually coupled with a scanning probe microscopy (SPM) technique such as in our case, a scanning tunneling microscope (STM). In this way, the STM tip is used to control the distance between the probe and the sample while acting as an antenna for the microwave field. Thanks to the peculiarity of our home-made setup, the SMM is a suitable method to study blisters formed on HOPG surface as consequence of an electrochemical treatment. Our system has a "broad-band" approach that opens the way to perform local microwave spectroscopy over a broad frequency range. Moreover, microwaves have the ability to penetrate into the sample allowing the sub-surface characterization of materials. The application of the SMM to characterize blisters formed on the HOPG surface provides information on the sub-layer structures.
扫描微波显微镜（SMM）基于样品与微波频率范围内的电磁倏逝场之间的相互作用。SMM通常与扫描探针显微镜（SPM）技术相结合，比如在我们的案例中，与扫描隧道显微镜（STM）相结合。通过这种方式，STM针尖在作为微波场天线的同时，还用于控制探针与样品之间的距离。由于我们自制装置的特性，SMM是研究因电化学处理在高定向热解石墨（HOPG）表面形成的水泡的合适方法。我们的系统采用“宽带”方法，为在宽频率范围内进行局部微波光谱分析开辟了道路。此外，微波能够穿透样品，从而实现材料的亚表面表征。应用SMM表征HOPG表面形成的水泡可提供有关亚层结构的信息。
