Department of Information Engineering, Università Politecnica delle Marche, Via Brecce Bianche, 60131 Ancona, Italy.
Department of Materials, Environmental Sciences and Urban Planning, Università Politecnica delle Marche, Via Brecce Bianche, 60131 Ancona, Italy.
Sensors (Basel). 2022 Dec 8;22(24):9608. doi: 10.3390/s22249608.
Scanning microwave microscopy (SMM) is a novel metrological tool that advances the quantitative, nanometric, high-frequency, electrical characterization of a broad range of materials of technological importance. In this work, we report an inverted near-field scanning microwave microscopy (iSMM) investigation of a graphene oxide-based epoxy nanocomposite material at a nanoscopic level. The high-resolution spatial mapping of local conductance provides a quantitative analysis of the sample's electrical properties. In particular, the electrical conductivity in the order of ∼10-1 S/m as well as the mapping of the dielectric constant with a value of ∼4.7 ± 0.2 are reported and validated by the full-wave electromagnetic modeling of the tip-sample interaction.
扫描微波显微镜（SMM）是一种新颖的计量工具，可对具有重要技术意义的广泛材料进行定量、纳米级、高频、电特性分析。在这项工作中，我们报告了一种基于氧化石墨烯的环氧树脂纳米复合材料在纳米尺度上的倒置近场扫描微波显微镜（iSMM）研究。局部电导的高分辨率空间映射提供了对样品电特性的定量分析。特别是，报告了约为 10-1 S/m 的电导率以及介电常数约为 4.7 ± 0.2 的映射，并通过对针尖-样品相互作用的全波电磁建模进行了验证。
